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  • 1-10 ل  34,307 نتائج ل ""[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics""

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Academic Journal

Interactions of Low-Energy Muons with Silicon: Numerical Simulation of Negative Muon Capture and Prospects for Soft Errors

Subjects: single-event effects; [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; muons

  • Source: Journal of Nuclear Engineering, Vol 5, Iss 1, Pp 91-110 (2024)

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Conference

Hea thin films as protective barrier against carbon diffusion during sps

Subjects: [SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]; [SPI.MAT]Engineering Sciences [physics]/Materials; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsAntibes; France

  • Source: 4th Plasma thin film international union meeting (Plathinium 2025)https://hal.science/hal-053343414th Plasma thin film international union meeting (Plathinium 2025), Sep 2025, Antibes,

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Croissance in-situ de nanoparticules d'oxyde de fer dans une matrice de polyisobutylène : vers des nanocomposites multifonctionnels

Subjects: mechanical reinforcement; magnetothermal; superparamagnetismParis; France

  • Source: 2eme journées du GDR MultiPODE “Multifunctional nanostructured POlymer systems by DEsign”https://hal.science/hal-053268202eme journées du GDR MultiPODE “Multifunctional

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Buffer engineering to boost the blocking voltage of GaN High Electron Mobility Transistors on sapphire

Subjects: GaN on sapphire; GaN Power Device; HEMT - High Electronic Mobility TransistorMalmö; Sweden

  • Source: 15th International Conference on Nitride Semiconductors (ICNS-15)https://hal.science/hal-0532126515th International Conference on Nitride Semiconductors (ICNS-15), Jul 2025, Malmö, Sweden

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Failure Mechanisms of GaN HEMTs in Single Event Destructive Short-Circuit at Different VDS Voltage Levels

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/ElectronicsBordeaux; France

  • Source: ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323097 ; ESREF 2025 : 36th

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Data-driven Metamodels for Failure Analysis of Power Electronic Modules

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [INFO.INFO-LG]Computer Science [cs]/Machine Learning [cs.LG]; [INFO.INFO-MO]Computer Science [cs]/Modeling and SimulationBordeaux; France

  • Source: 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2025)https://hal.science/hal-0532309136th European Symposium

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Aging of p-GaN gate HEMTs under hard-switching conditions

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/ElectronicsBordeaux; France

  • Source: ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323081 ; ESREF 2025 : 36th

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Permanent degradation of p-GaN HEMTs due to repetitive overvoltage stress during hard turn-off switching

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/ElectronicsBordeaux; France

  • Source: ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323111 ; ESREF 2025 : 36th

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Early-life drift mechanism investigation of 150nm GaN-on-SiC HEMT RF under accelerated DC test

Subjects: early-life; HEMTs GaN; DC-HTOLBordeaux; France

  • Source: ESREF 2025 - 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323093 ; ESREF 2025 - 36th

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High-Temperature Dual-Rail Contactless MEMS Logic for Industrial Edge Computing

Subjects: logic gates; MEMS; High-temperature MEMS logic gatesKaohsiung; Taiwan

  • Source: 2025 IEEE 38th International Conference on Micro Electro Mechanical Systems (MEMS)https://laas.hal.science/hal-052278462025 IEEE 38th International

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  • 1-10 ل  34,307 نتائج ل ""[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics""