نتائج البحث

Numerical investigation and analysis of heat transfer and thin film flow of Fe3O4 and Al2O3 nanoparticles dispersed in H2O over vertical stretching sheet.

• Authors : Hayat, Umer¹ (AUTHOR) ; Shaiq, Shakil² (AUTHOR); Shahzad, Azeem¹ (AUTHOR)

• Source: Numerical Heat Transfer: Part A -- Applications. Apr2025, Vol. 86 Issue 9, p2778-2792. 15p.

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Fabrication and Characterization of Binary Ti-Al and Ti-Si Thin-Film Metallic Glasses.

• Authors : Knap, Vidžaja¹ (AUTHOR) ; Vlcak, Petr^1,2 (AUTHOR); Žaloudková, Margit^2,3 (AUTHOR)

• Source: Materials (1996-1944). Feb2026, Vol. 19 Issue 4, p802. 11p.

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MODELING AND SIMULATIONS OF THIN FILM MAGNETIZED SISKO FLUID-FLOW ON AN UNSTEADY STRETCHING SURFACE.

• Authors : MAHARIQ, Ibrahim^1,2,3,4; FIZA, Mehreen⁵; ABAS, Syed Arshad⁵

• Source: Thermal Science. 2025, Vol. 29 Issue 4B, p3045-3059. 15p.

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Round and pleated blisters: interface delamination in thin film deposition.

• Authors : Wang, Wenxiang¹ (AUTHOR); Chen, Shengyao² (AUTHOR); Cao, Jiacong¹ (AUTHOR)

• Source: International Journal of Smart & Nano Materials. Jun2025, Vol. 16 Issue 2, p343-358. 16p.

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W-ion irradiation promotes dense TiBx film growth during magnetron sputtering without substrate heating

• Authors : Viskupova, K.; Sroba, V.; Lu, J.

Subjects: Thin films; Diboride coatings; Magnetron sputtering

• Source: Surface & Coatings Technology. 497

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Development of Thin Film Layers for Solar Cells through Advanced Deposition Methods

• Authors : Porcar García, Samuel; University/Department: Universitat Jaume I. Escola de Doctorat; ...

Subjects: Photovoltaic solar cells; Thin films; Chemical routes

• Source: TDX (Tesis Doctorals en Xarxa)

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Revealing the nature of surface charging during X-ray photoelectron spectroscopy analysis of thin film insulators with metal capping layers

• Authors : Greczynski, Grzegorz

Subjects: XPS; Insulators; Charging

• Source: Applied Surface Science. 709

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Pseudomorphic replication as enabling technology for porphyrinic metal–organic framework thin film growth

• Authors : Suremann, Nina F.; Laporte, Annechien A.H.; Greenwell, Francesca

Subjects: Atomic layer deposition; Metal–organic frameworks; Scanning electron microscopy

• Source: Polyhedron. 275

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Dynamic Buckling Analysis of Thin Film/Polydimethylsiloxane Substrate Structures in Curved State with Finite Thickness.

• Authors : Bi, Haohao¹ (AUTHOR) ; Li, Wenjie¹ (AUTHOR); Wang, Liuyun¹ (AUTHOR)

• Source: Polymers (20734360). Feb2026, Vol. 18 Issue 3, p411. 21p.

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Ultrahigh Power Factor of Sputtered Nanocrystalline N‐Type Bi2Te3 Thin Film via Vacancy Defect Modulation and Ti Additives.

• Authors : Gong, Tingrui^1,2 (AUTHOR) ; Gao, Lei^1,2 (AUTHOR); Kang, Lingfeng^1,2 (AUTHOR)

• Source: Advanced Science. 10/16/2024, Vol. 11 Issue 38, p1-11. 11p.

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