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1/f Noise Mitigation in an Opto-Mechanical Sensor with a Fabry–Pérot Interferometer.

• Authors : Nelson, Andrea M.^1,2 (AUTHOR); Sanjuan, Jose^1,2 (AUTHOR); Guzmán, Felipe¹ (AUTHOR)

• Source: Sensors (14248220). 3/15/2024, Vol. 24 Issue 6, p1-14. 14p. 4 Graphs.

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Recurrence Resonance and 1/f Noise in Neurons Under Quantum Conditions and Their Manifestations in Proteinoid Microspheres.

• Authors : Huang Y; Department of Intermediate Art and Science, School of Fundamental Science and Engineering, Waseda University, Tokyo 169-8555, Japan.; Mougkogiannis P

• Source: Entropy (Basel, Switzerland) [Entropy (Basel)] 2025 Feb 01; Vol. 27 (2). Date of Electronic Publication: 2025 Feb 01.Publisher: MDPI Country of Publication: Switzerland NLM ID: 101243874 Publication Model: Electronic Cited Medium:

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Low-frequency 1/f noise characteristics of ultra-thin AlOx-based resistive switching memory devices with magneto-resistive responses

• Authors : Hong, JY.; Chen, CY.; Ling, DC. ...

Subjects: Hooge’s Parameter; Low-Frequency 1/F Noise; Magneto-Resistance (Mr)

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The DEPFET Sensor-Amplifier Structure: A Method to Beat 1/f Noise and Reach Sub-Electron Noise in Pixel Detectors.

• Authors : Lutz, Gerhard¹ ; Porro, Matteo² ; Aschauer, Stefan¹

• Source: Sensors (14248220). May2016, Vol. 16 Issue 5, p608. 14p.

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1/f Noise Modelling and Characterization for CMOS Quanta Image Sensors.

• Authors : Deng W; Thayer School of Engineering, Dartmouth College, Hanover, NH 03755, USA.; Fossum ER

• Source: Sensors (Basel, Switzerland) [Sensors (Basel)] 2019 Dec 11; Vol. 19 (24). Date of Electronic Publication: 2019 Dec 11.Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium:

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Fluctuations in Upper and Lower Body Movement during Walking in Normal Pressure Hydrocephalus and Parkinson's Disease Assessed by Motion Capture with a Smartphone Application, TDPT-GT.

• Authors : Iseki, Chifumi^1,2 (AUTHOR) ; Suzuki, Shou³ (AUTHOR) ; Fukami, Tadanori³ (AUTHOR)

• Source: Sensors (14248220). Nov2023, Vol. 23 Issue 22, p9263. 15p.

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Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor †.

• Authors : Chao, Calvin Yi-Ping¹ (AUTHOR) ; Wu, Thomas Meng-Hsiu¹ (AUTHOR); Yeh, Shang-Fu¹ (AUTHOR)

• Source: Sensors (14248220). Sep2023, Vol. 23 Issue 18, p7959. 14p.

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Multi-Fractal Weibull Adaptive Model for the Remaining Useful Life Prediction of Electric Vehicle Lithium Batteries.

• Authors : Deng, Wujin¹ (AUTHOR) ; Gao, Yan¹ (AUTHOR) ; Chen, Jianxue¹ (AUTHOR)

• Source: Entropy. Apr2023, Vol. 25 Issue 4, p646. 18p.

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A Low-Noise High-Resolution Temperature Measurement Technique Based on Inductive Voltage Divider and Alternating-Current Bridge.

• Authors : Gao, Shanghua^1,2 (AUTHOR); Zhu, Xiaoyi^1,2 (AUTHOR); Zhang, Xiaofeng³ (AUTHOR)

• Source: Sensors (14248220). May2025, Vol. 25 Issue 9, p2777. 16p.

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Review on Excess Noise Measurements of Resistors.

• Authors : Walter, Daniela¹ (AUTHOR) ; Bülau, André¹ (AUTHOR); Zimmermann, André^1,2 (AUTHOR)

• Source: Sensors (14248220). Feb2023, Vol. 23 Issue 3, p1107. 29p.

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