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1/f Noise reduction in cryogenic highly compensated silicon thermistors

• Authors : Blond, Jeremy; Aliane, Abdelkader; Meilhan, Jerome ...

Subjects: thermistor; TCR; 1/f noise

• Source: ISSN: 0741-3106 ; IEEE Electron Device Letters ; https://hal.science/hal-04704828 ; IEEE Electron Device Letters, 2020, 41 (12), pp.1746-1749. ⟨10.1109/LED.2020.3032824⟩ ;

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Annealing Ambient and Film Thickness Dependent NO2Response and 1/f Noise Characteristics of IGZO Resistor-Type Gas Sensors

• Authors : Shin, Wonjun; Koo, Ryun-Han; Hong, Seongbin ...

Subjects: Gas sensor; IGZO; limit of detection (LOD)

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1/f Noise in Ceramic Superconductors and Granular Resistors

• Authors : Dept. of Electr. Eng., Kyushu Inst. of Technol. , Japan; Takagi, Keiji; Mizunami, Toru

Subjects: Journal Article; VoR

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Statistical analysis of 1/f noise in enclosed-gate N- and PMOS transistors

• Authors : Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou); Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou); Μαυρεδακης Νικολαος(http://users.isc.tuc.gr/~nmavredakis)

Subjects: Enclosed gate; Low frequency noise; Variability

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Proton Irradiation Effects on Resistive Random Access Memory With ZrOX/HfOX Stacks

• Authors : Lee, Daeseok; Lee, Joonmyoung; Jung, Seungjae ...

Subjects: 1/F NOISE; BREAKDOWN; DAMAGE

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Low-Frequency Noise Characterization of BEOL Metal–Insulator–Metal Capacitors

• Authors : Giusi, Gino; Saini, Nishant; Croes, Kristof ...

Subjects: Science & Technology; Technology; Physical Sciences

• Source: ISSN:0018-9383 ; ISSN:1557-9646 ; Ieee Transactions On Electron Devices, vol. 72 (4.

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Charge-based compact model for bias-dependent variability of 1/f noise in MOSFETs

• Authors : Μαυρεδακης Νικολαος(http://users.isc.tuc.gr/~nmavredakis); Mavredakis Nikolaos(http://users.isc.tuc.gr/~nmavredakis); Μακρης Νικολαος(http://users.isc.tuc.gr/~NMakris)

Subjects: Charge-based model; LFN,Low Frequency Noise; MOSFET

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The Tobin Coefficient: A Relevant Photodetector Performance Metric for IR Imaging

• Authors : Gravrand, Olivier; Kerlain, Alexandre; Sam-Giao, Diane ...

Subjects: HgCdTe; 1/f noise; infrared

• Source: ISSN: 0361-5235.

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A Chaotic Switched-Capacitor Circuit for 1/f Noise Generation

• Authors : Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo; Delgado Restituto, Manuel; Rodríguez Vázquez, Ángel Benito

Subjects: IC oscillators; Nonlinear microelectronics; Switched-capacitor circuits

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Estimating low-temperature RTS rate in MCT FPA through high-temperature noise measurements

• Authors : Claret, Antoine; Cervera, Cyril; Baier, Nicolas ...

Subjects: MCT detection; random telegraph signal; 1/f noise

• Source: ISSN: 0361-5235.

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