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The shortest experiment for linear system identification

• Authors : Camlibel, M. K.; van Waarde, H. J.; Rapisarda, P.

Subjects: Experiment design; Linear systems; System identification

• Source: Camlibel, M K, van Waarde, H J & Rapisarda, P 2025, 'The shortest experiment for linear system identification', Systems and Control

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The shortest experiment for linear system identification

• Authors : Camlibel, M. K.; van Waarde, H. J.; Rapisarda, P.

Subjects: Experiment design; Linear systems; System identification

• Source: Camlibel, M K, van Waarde, H J & Rapisarda, P 2025, 'The shortest experiment for linear system identification', Systems and Control

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Chebyshev centers and radii for sets induced by quadratic matrix inequalities

• Authors : Shakouri, Amir; van Waarde, Henk J.; Camlibel, M. Kanat

Subjects: Quadratic matrix inequality; Chebyshev center; Chebyshev radius

• Source: Shakouri, A, van Waarde, H J & Camlibel, M K 2025, 'Chebyshev centers and radii for sets induced by quadratic matrix inequalities', Mathematics of Control, Signals, and Systems, vol. 37, no. 4, pp.

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Direct comparison of nanoscale plasticity in single and bi-crystal tensile tests extracted from a zinc coating

• Authors : König, D.; Vermeij, T.; Maresca, F.

Subjects: Digital image correlation; Electron backscatter diffraction (EBSD); Mechanical properties (slip)

• Source: König, D, Vermeij, T, Maresca, F & Hoefnagels, J P M 2025, 'Direct comparison of nanoscale plasticity in single and bi-crystal tensile tests extracted from a zinc coating', Materials Science and

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Direct comparison of nanoscale plasticity in single and bi-crystal tensile tests extracted from a zinc coating

• Authors : König, D.; Vermeij, T.; Maresca, F.

Subjects: Digital image correlation; Electron backscatter diffraction (EBSD); Mechanical properties (slip)

• Source: König, D, Vermeij, T, Maresca, F & Hoefnagels, J P M 2025, 'Direct comparison of nanoscale plasticity in single and bi-crystal tensile tests extracted from a zinc coating', Materials Science and

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System theory and system identification of compartmental systems

• Authors : Hof, Jacoba Marchiena van den

• Source: Hof, J M V D 1996, 'System theory and system identification of compartmental systems', Doctor of

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A Quantitative Notion of Persistency of Excitation and the Robust Fundamental Lemma

• Authors : Coulson, Jeremy; Waarde, Henk J.Van; Lygeros, John

Subjects: Linear systems; system identification

• Source: Coulson, J, Waarde, H J V, Lygeros, J & Dorfler, F 2023, 'A Quantitative Notion of Persistency of Excitation and the Robust Fundamental Lemma', IEEE Control Systems Letters, vol. 7, pp. 1243-1248.

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Kernel-Based Models for System Analysis

• Authors : Van Waarde, Henk J.; Sepulchre, Rodolphe

Subjects: Identification for control; machine learning; modeling

• Source: Van Waarde, H J & Sepulchre, R 2023, 'Kernel-Based Models for System Analysis', IEEE Transactions on Automatic Control, vol. 68, no. 9, pp. 5317-5332.

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A Quantitative Notion of Persistency of Excitation and the Robust Fundamental Lemma

• Authors : Coulson, Jeremy; Waarde, Henk J.Van; Lygeros, John

Subjects: Linear systems; system identification

• Source: Coulson, J, Waarde, H J V, Lygeros, J & Dorfler, F 2023, 'A Quantitative Notion of Persistency of Excitation and the Robust Fundamental Lemma', IEEE Control Systems Letters, vol. 7, pp. 1243-1248.

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Kernel-Based Models for System Analysis

• Authors : Van Waarde, Henk J.; Sepulchre, Rodolphe

Subjects: Identification for control; machine learning; modeling

• Source: Van Waarde, H J & Sepulchre, R 2023, 'Kernel-Based Models for System Analysis', IEEE Transactions on Automatic Control, vol. 68, no. 9, pp. 5317-5332.

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