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Conference

Test Case Purification for Improving Fault Localization

Subjects: Test case purification; spectrum-based fault localization; test case atomizationHong Kong; China

  • Source: FSE - 22nd ACM SIGSOFT International Symposium on the Foundations of Software Engineering ; https://inria.hal.science/hal-01061911 ; FSE - 22nd ACM SIGSOFT International Symposium on the Foundations

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  • 1-5 ل  5 نتائج ل ""HONG Kong (China)""