Subjects: Reconfigurable Computing--Field Programmable Gate Array (FPGA)--Genetic Algorithm--Evolvable Hardware--Reliability--Resilience--Energy-Aware--Fault-tolerance--Adaptable Computer Architecture--Design Diversity--Common Mode Failure (CMF)--Triple Modular Redundancy (TMR)--Hard Faults--Permanent Faults--Transistor Aging--Bias Temperature Instability (BTI)--Negative Bias Temperature Instability (NBTI)--Hot-Carrier Injection (HCI)--Timing Degradation--Threshold Voltage--Power-Gating--Reliability Analysis--Logic Datapath--Digital Circuit--Timing Sensors--Design Guardband--Application Specific Integrated Circuit (ASIC)--Process Variation (PV)--Soft Error--Transient Faults--Application Vulnerability Characterization--Near-Threshold Voltage (NTV)--Fault Injection--Fault Propagation--Performance--Throughput--High Performance Computing (HPC)--Message Passing Interface (MPI) Applications--Distributed Applications--Exascale Computing--Energy-Efficiency--Compiler Optimizations--Software Transformations
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