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A critical look at the use of SEM in international business research

• Authors : Richter, Nicole; Sinkovics, Rudolf R; Ringle, Christian

Subjects: International business research; structural equation modeling; SEM

• Source: Richter, N, Sinkovics, R R, Ringle, C & Schlägel, C 2016, 'A critical look at the use of SEM in international business research', International Marketing Review, vol.

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Toughening mechanisms in cost-effective carbon-epoxy laminates with thermoplastic veils:Mode-I and in-situ SEM fracture characterisation

• Authors : İnal, O.; Akbolat, Mehmet; Soutis, C.

Subjects: interlaminar fracture; thermoplastic interleaving; toughening mechanisms

• Source: İnal, O, Akbolat, M, Soutis, C & Katnam, K B 2021, 'Toughening mechanisms in cost-effective carbon-epoxy laminates with thermoplastic veils : Mode-I and in-situ SEM

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Research Data for: 'Improving Quantum Well Tube Homogeneity Using Strained Nanowire Heterostructures' -Imagery, Spectra, and SEM

• Authors : Parkinson, Patrick; Patel, Nikesh; Medical Education (L5)

Subjects: PL; SEM; nanoskiving

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Analysed Data for Nanoskived GaAsP/GaAs Heterostructures: PL Spectra Fit Parameters, Geometrical Data from SEM, Transition Energies from Nextnano Simulations

• Authors : Patel, Nikesh; Parkinson, Patrick; Church, Stephen

Subjects: PL; SEM; nanoskiving

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SEM image analysis of freeze-cast and lyophilised Ti3C2Tz aerogels

• Authors : Bird, James; The University of Manchester; Department of Materials

Subjects: Ti3C2Tz MXene; SEM; Python

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SEM & EDX (Zeiss Sigma) of MXene nanoparticles

• Authors : Bird, James; Department of Materials

Subjects: SEM; EDX; Ti3C2Tx MXene

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SEM - Zeiss Ultra 55 IV

• Authors : Bird, James; Department of Materials

Subjects: SEM; PSD; EDX

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SEM & EDX (Zeiss Sigma) of both dropcast and freeze-cast MXene nanoparticles

• Authors : Bird, James; Department of Materials

Subjects: Ti3C2Tx MXene; SEM; EDX

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SEM & EDX (Zeiss Sigma) of both dropcast and freeze-cast MXene nanoparticles

• Authors : Bird, James; The University of Manchester; Department of Materials

Subjects: Ti3C2Tx MXene; SEM; EDX particle size distribution measurement

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Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) Serial Section Tomography (SST)

• Authors : Gholinia, Ali; Withers, Philip; Taylor, Kevin

Subjects: Serial Block-Face Scanning Electron Microscopy (SBEM); Computed Tomography (CT); Geology

• Source: Gholinia, A, Withers, P, Taylor, K, Curd, M, Bousser, E, Hosman, T, Coyle, S, Hassel-Shearer, M & Hunt, J 2020, 'Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-

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