نتائج البحث

Quantifying Interpretability and Structural Differences in Atomic Resolution Electron Microscopy Images

• Authors : Lomholdt, William Bang

• Source: Lomholdt , W B 2024 , Quantifying Interpretability and Structural Differences in Atomic Resolution Electron Microscopy Images . DTU

تفاصيل العنوان

Interpretability of high-resolution transmission electron microscopy images

• Authors : Lomholdt, William Bang; Leth Larsen, Matthew Helmi; Valencia, Cuauhtemoc Nuñez

Subjects: HRTEM; Interpretability; Nanoparticles

• Source: Lomholdt , W B , Leth Larsen , M H , Valencia , C N , Schiøtz , J & Hansen , T W 2024 , ' Interpretability of high-resolution transmission electron microscopy

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Simulating dark-field X-ray microscopy images with wavefront propagation techniques

• Authors : Carlsen, Mads; Detlefs, Carsten; Yildirim, Can

Subjects: Diffraction imaging; Dynamical diffraction; Simulation

• Source: Carlsen , M , Detlefs , C , Yildirim , C , Ræder , T & Simons , H 2022 , ' Simulating dark-field X-ray microscopy images with wavefront

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A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron Microscopy Images

• Authors : Madsen, Jacob; Liu, Pei; Kling, Jens

• Source: Madsen , J , Liu , P , Kling , J , Wagner , J B , Hansen , T W , Winther , O & Schiøtz , J 2018 , ' A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron

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Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

• Authors : Madsen, Jacob; Liu, Pei; Wagner, Jakob Birkedal

Subjects: High-resolution transmission electron microscopy; Strain mapping; Nanoparticles

• Source: Madsen , J , Liu , P , Wagner , J B , Hansen , T W & Schiøtz , J 2017 , ' Correction to: Accuracy of surface strain measurements from transmission electron microscopy

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Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

• Authors : Madsen, Jacob; Liu, Pei; Wagner, Jakob Birkedal

Subjects: High-resolution transmission electron microscopy; Strain mapping; Nanoparticles

• Source: Madsen , J , Liu , P , Wagner , J B , Hansen , T W & Schiøtz , J 2017 , ' Accuracy of surface strain measurements from transmission electron microscopy

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