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  • 1-10 ل  1,934 نتائج ل ""[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics""

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Collection : Hal-Cea (Commissariat A L'energie Atomique Et Aux Energies Alternatives)
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Conference

Early-life drift mechanism investigation of 150nm GaN-on-SiC HEMT RF under accelerated DC test

Subjects: early-life; HEMTs GaN; DC-HTOLBordeaux; France

  • Source: ESREF 2025 - 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323093 ; ESREF 2025 - 36th

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Conference

Dual-mode 16kb memory: transforming a ferroelectric capacitor bitcell into resistive filamentary memory

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMonterey; United States

  • Source: IMW 2025 - 2025 IEEE International Memory Workshop ; https://cea.hal.science/cea-05273371 ; IMW 2025 - 2025 IEEE International Memory Workshop, May 2025, Monterey, United States. 2025, 2025 IEEE

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Conference

Improvement of the high-temperature performance of multi-element ultrasonic transducers

Subjects: [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]; [CHIM.MATE]Chemical Sciences/Material chemistry; [PHYS.MECA.ACOU]Physics [physics]/Mechanics [physics]/Acoustics [physics.class-ph]Valence; SpainValence, Spain

  • Source: ANIMMA 2025 - 9th International Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications ; https://cea.hal.science/cea-05272276 ; ANIMMA 2025 - 9th

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Conference

Dynamic Landau-Lifshitz-Bloch-Slonczewski equations for spintronics ; Équations dynamiques de Landau-Lifshitz-Bloch-Slonczewski pour la spintronique

Subjects: Magnetization Dynamics; Ultrafast Dynamics; SpintronicPalm Beach; United States

  • Source: MMM 2025 - 70th Annual Conference on Magnetism and Magnetic Materials ; https://hal.science/hal-05298611 ; MMM 2025 - 70th Annual Conference on Magnetism and Magnetic Materials, Oct 2025, Palm Beach,

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Conference

Early-life drift mechanism investigation of 150nm GaN-on-SiC HEMT RF under accelerated DC test

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/ElectronicsBordeaux; France

  • Source: ESREF 2025 - 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323093 ; ESREF 2025 - 36th

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Conference

Aging of p-GaN gate HEMTs under hard-switching conditions

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/ElectronicsBordeaux; France

  • Source: ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323081 ; ESREF 2025 : 36th

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Conference

Top and cross-sectional Failure Analysis investigations by AFM, FIB and SEM: elucidation of an unwanted layer growth in integrated microelectronic chip

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/ElectronicsBordeaux; France

  • Source: ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05323122 ; ESREF 2025 : 36th

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Conference

High-Temperature Dual-Rail Contactless MEMS Logic for Industrial Edge Computing

Subjects: logic gates; MEMS; High-temperature MEMS logic gatesKaohsiung; Taiwan

  • Source: 2025 IEEE 38th International Conference on Micro Electro Mechanical Systems (MEMS)https://laas.hal.science/hal-052278462025 IEEE 38th International

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Conference

Avalanche stress study of 4H-SiC power devices: impact of voltage rating and substrate for JBS and PiN diodes

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/ElectronicsBusan; South Korea

  • Source: ICSCRM 2025 - The 22ND International Conference on Silicon Carbide and. Related Materials ; https://cea.hal.science/cea-05291091 ; ICSCRM 2025 - The 22ND International Conference on Silicon Carbide

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Conference

Self-heating calibration in SiC power diodes

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsBusan; South Korea

  • Source: ICSCRM 2025 - The 22ND International Conference on Silicon Carbide and Related Materials ; https://cea.hal.science/cea-05291090 ; ICSCRM 2025 - The 22ND International Conference on Silicon Carbide and

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  • 1-10 ل  1,934 نتائج ل ""[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics""