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Academic Journal

Correlated TKD/EDS - TEM - APT analysis on selected interfaces of CoSi2 thin films

Subjects: site-specific sample preparation; thin films; interfaces/interphases

  • Source: ISSN: 0304-3991 ; Ultramicroscopy ; https://hal.science/hal-02403191 ; Ultramicroscopy, 2019, 206, pp.112807. ⟨10.1016/j.ultramic.2019.06.007⟩.

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