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Comparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1-2 keV.
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- المؤلفون: Kozhevnikov, I. V.; Filatova, E. O.; Sokolov, A. A.; Konashuk, A. S.; Siewert, F.; Störmer, M.; Gaudin, J.; Keitel, B.; Samoylova, L.; Sinn, H.
- المصدر:
Journal of Synchrotron Radiation. Mar2015, Vol. 22 Issue 2, p348-353. 6p.
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