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Academic Journal

The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron Microscopy.

  • Authors : Chuah J; Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583, Singapore.; Khursheed A

  • Source: Materials (Basel, Switzerland) [Materials (Basel)] 2021 Dec 07; Vol. 14 (24). Date of Electronic Publication: 2021 Dec 07.Publisher: MDPI Country of Publication: Switzerland NLM ID: 101555929 Publication Model: Electronic Cited Medium: Print ISSN: 1996-1944 (Print)

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