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Electronic Resource

Shortening the Edinburgh postnatal depression scale using optimal test assembly methods:Development of the EPDS-Dep-5

Subjects: depression; optimal test assembly; patient-reported outcome

  • Source: Harel , D , Levis , B , Ishihara , M , Levis , A W , Vigod , S N , Howard , L M , Thombs , B D , Benedetti , A , Sun , Y , He , C , Krishnan , A , Wu , Y , Bhandari , P M , Neupane , D , Negeri , Z ,

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Academic Journal

Item exposure and utilization control methods for optimal test assembly

  • Source: Behaviormetrika ; volume 51, issue 1, page 125-156 ; ISSN 0385-7417 1349-6964

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  • 1-10 ل  68 نتائج ل ""Optimal test assembly""