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A Robust Bayesian approach for reliability prognosis of one-shot devices under cumulative risk model

• Authors : Baghel, Shanya; Mondal, Shuvashree

Subjects: Statistics - Methodology; Statistics - Applications

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Imputing Missing Data in One-Shot Devices Using Unsupervised Learning Approach.

• Authors : So, Hon Yiu¹ (AUTHOR) ; Ling, Man Ho² (AUTHOR) ; Balakrishnan, Narayanaswamy³ (AUTHOR)

• Source: Mathematics (2227-7390). Sep2024, Vol. 12 Issue 18, p2884. 33p.

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Imputing Missing Data in One-Shot Devices Using Unsupervised Learning Approach

• Authors : Hon Yiu So; Man Ho Ling; Narayanaswamy Balakrishnan

Subjects: one-shot devices; missing data; clustering

• Source: Mathematics, Vol 12, Iss 18, p 2884 (2024)

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Robust statistical inference for one-shot devices based on divergences

• Authors : Castilla, Elena; BHL Australia

• Source: 155:114-115

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On reliability analysis of one-shot devices with manufacturing defects.

• Authors : Shang, Xiangwen¹ (AUTHOR); Ng, Hon Keung Tony¹ (AUTHOR); Ling, Man Ho² (AUTHOR)

Subjects: *MANUFACTURING defects; *MONTE Carlo method; *MAXIMUM likelihood statistics

• Source: Quality Engineering. 2023, Vol. 35 Issue 1, p79-94. 16p.

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Selecting optimal preventive maintenance periods for one-shot devices: a new fuzzy decision approach.

• Authors : Azimian, Meysam¹ ; Karbasian, Mahdi¹ ; Atashgar, Karim¹

• Source: Production & Operations Management (2251-6409). Winter2022, Vol. 12 Issue 4, p21-39. 19p.

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Optimal Constant-Stress Accelerated Life Test Plans for One-Shot Devices with Components Having Exponential Lifetimes under Gamma Frailty Models

• Authors : Man-Ho Ling

Subjects: gamma frailty; exponential distribution; constant-stress accelerated life tests

• Source: Mathematics, Vol 10, Iss 5, p 840 (2022)

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Inference for One-Shot Devices with Dependent k-Out-of-M Structured Components under Gamma Frailty

• Authors : Man-Ho Ling; Narayanaswamy Balakrishnan; Chenxi Yu

Subjects: gamma frailty; accelerated life-tests; one-shot devices

• Source: Mathematics, Vol 9, Iss 23, p 3032 (2021)

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Robust statistical inference for one-shot devices based on divergences

• Authors : Martín Apaolaza, Nirian; Pardo Llorente, Leandro; Castilla González, Elena María

Subjects: doctoral thesis

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Shock and Vibration Margin Testing for One-Shot Devices in the Energy-Based Capability Framework.

• Authors : Savoie, Troy

• Source: Conference: Proposed for presentation at the HOCWOG in support of JOWOG-31 held June 2-6, 2014 in Aldermaston, UK.

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