نتائج البحث

Low energy electron irradiation induced charging of dielectric materials: measurements and analyses ; Charge induite dans les diélectriques par des électrons de basses énergies: mesures et analyses

• Authors : Belhaj, Mohamed; Dadouch, Sarah;

Subjects: SECONDARY ELECTRON; ELECTRON IRRADIATION; CHARGINGORLANDO; United States

• Source: 2019 IEEE Pulsed Power & Plasma Science (PPPS)2019 IEEE Pulsed Power and Plasma Science Conferencehttps://hal.science/hal-024870422019 IEEE Pulsed Power and Plasma Science

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Electromagnetic Wave Reflection from Shocked Dielectric Materials

• Authors : Rougier, Benoit; Aubert, Hervé; Lefrançois, Alexandre ...

Subjects: [SPI.ELEC]Engineering Sciences [physics]/ElectromagnetismBoston; United StatesBoston, United States

• Source: IEEE Antennas and Propagation Symposium ; https://laas.hal.science/hal-01876698 ; IEEE Antennas and Propagation Symposium, Jul 2018, Boston, United States. 3p.,

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EXPERIMENTAL STUDY OF MULTIPACTOR SUPPRESSION IN DIELECTRIC MATERIALS

• Authors : El Khaldi, Mohamed; Kaabi, Walid;

Subjects: [PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph]Richmond; United States

• Source: Proceedings of IPAC2015, Richmond, VA, USA ; IPAC'15, the sixth International Particle Accelerator Conference, ; https://hal.in2p3.fr/in2p3-01206199 ; IPAC'15, the sixth International Particle

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Electron Emission Properties of Space Used Dielectric Materials

• Authors : Belhaj, M.; Paulmier, T.; Rodgers, D. ...

Subjects: electron impact; dielectrics; secondary electronsUnited StatesPASADENA, United States

• Source: Spacecraft Charging Technology Conference 2014 (13th SCTC) ; https://hal.science/hal-01081400 ; Spacecraft Charging Technology Conference 2014 (13th SCTC), Jun 2014, PASADENA,

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Dielectric engineering of nanostructured layers preventing electrostatic charging in thin dielectrics

• Authors : Makasheva, Kremena; Villeneuve-Faure, Christina; Bonafos, Caroline ...

Subjects: Nanostructured dielectrics; Plasma process; RF MEMS capacitive switchesAnchorage; United States

• Source: 2015 IEEE Nanotechnology Materials and Devices Conference (NMDC)Nanotechnology Materials and Devices Conference (NMDC), 2015 IEEE

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First demondtration of heat dissipation improvement in CMOS technology using Silicon-On-Diamond (SOD) substrates

• Authors : Mazelier, J.-P.; Widiez, J.; Andrieu, F. ...

Subjects: diamond; Fully Depleted MOSFET; instrumentationFoster City; United States

• Source: IEEE International SOI Conference ; https://hal.science/hal-00604213 ; IEEE International SOI Conference, Oct 2009, Foster City, United States.

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Toward fabrication of devices based on graphene/oxide multilayers

• Authors : Wang, Y; Guerenneur, A; Ramadan, S

Subjects: United States

• Source: 3267 ; 3261

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Tunable Mie-resonant dielectric metasurfaces based on VO2 phase-change materials

• Authors : Kruk, Sergey; John, Jimmy; Zhang, Zhen ...

Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicWashington; United StatesWashington, United States

• Source: CLEO: QELS_Fundamental Science ; https://hal.science/hal-02952041 ; CLEO: QELS_Fundamental Science, May 2020, Washington, United States. pp.FTh3Q.4,

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Julius Springer Prize for Applied Physics 2001 awarded to Eli Yablonovitch for his pioneering work on Photonic Crystals.

• Authors : Stuke, Michael; Trager, Frank

• Source: Applied Physics A: Materials Science & Processing. 2001, Vol. 73 Issue 4, p399. 1p.

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POTOMAC: towards a realistic secondary and backscattered emission model for the multipactor ; POTOMAC : vers un modèle réaliste de secondaires et rétrodiffusés pour le multipactor

• Authors : Plaçais, Adrien; Belhaj, Mohamed; Hillairet, Julien ...

Subjects: ELECTRON EMISSION; SECONDARY ELECTRONS; BACKSCATTERED ELECTRONSORLANDO; United States

• Source: 2019 IEEE Pulsed Power and Plasma Science Conferencehttps://hal.science/hal-024870232019 IEEE Pulsed Power and Plasma Science Conference, Jun 2019, ORLANDO, United

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