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Impact of strain on access resistance in planar and nanowire CMOS devices

• Authors : Berthelon, Rémy; Andneu, F.; Triozon, F. ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsKyoto; JapanKyoto, Japan

• Source: 2017 VLSI-Technology Technical Digest2017 IEEE Symposium on VLSI Technologyhttps://hal.science/hal-020502202017 IEEE Symposium on VLSI Technology, Jun 2017, Kyoto,

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The Route to Nanoscale Terahertz Technology: Nanowire-based Terahertz Detectors and Terahertz Modulators

• Authors : Boland, Jessica L; Peng, Kun; Baig, Sarwat

Subjects: Nagoya; Japan

• Source: Proceedings of the 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018)

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Thermal consideration in nanoscale gate-all-around vertical transistors

• Authors : Larrieu, Guilhem; Rezgui, Houssem; Kumar, Abhishek ...

Subjects: [SPI]Engineering Sciences [physics]; [PHYS]Physics [physics]Kyoto; JapanKyoto, Japan

• Source: 2023 Silicon Nanoelectronics Workshop (SNW)Silicon Nanoelectronics Workshop (SNW 2023)https://laas.hal.science/hal-04189328Silicon Nanoelectronics Workshop (SNW 2023), Jun 2023,

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Subwavelength low-loss silica wires guide light.

• Authors : Wallace, John

• Source: Laser Focus World. Feb2004, Vol. 40 Issue 2, p15-18. 2p.

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Towards three-dimensional endoscopy, a multiwavelength bio-wire, and more.

• Source: Nature Photonics. Sep2007, Vol. 1 Issue 9, p507-507. 1p. 1 Color Photograph.

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Single-electron memory counts them in and out.

• Source: Electronics Systems & Software. Dec2004/Jan2005, Vol. 2 Issue 6, p8-8. 1/3p. 1 Black and White Photograph.

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CMOS roadmap analysis from the perspective of III-V technology using MASTAR

• Authors : Hiblot, Gaspard; Rafhay, Quentin; Mugny, Gabriel ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsKyoto; JapanKyoto, Japan

• Source: 2015 SNW proceedings2015 Silicon Nanoelectronics Workshop (SNW)https://hal.science/hal-020497822015 Silicon Nanoelectronics Workshop (SNW), Jun 2015, Kyoto,

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