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  • 1-5 ل  5 نتائج ل ""Remaining useful lifetime""

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Conference

Wire-bond Contact Degradation Modelling for Remaining Useful Lifetime Prognosis of IGBT Power Modules

Subjects: CRACK PROPAGATION; CONTACT RESISTANCE; IGBT SEMICONDUCTORAthènes; Greece

  • Source: Microelectronics Reliability ; ESREF 2020, 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-03153075 ; ESREF 2020, 31st European

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Conference

Wire-bond Contact Degradation Modelling for Remaining Useful Lifetime Prognosis of IGBT Power Modules

Subjects: CRACK PROPAGATION; CONTACT RESISTANCE; IGBT SEMICONDUCTORAthènes; Greece

  • Source: Microelectronics Reliability ; ESREF 2020, 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-03153075 ; ESREF 2020, 31st European

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Conference

Wire-bond Contact Degradation Modelling for Remaining Useful Lifetime Prognosis of IGBT Power Modules

Subjects: CRACK PROPAGATION; CONTACT RESISTANCE; IGBT SEMICONDUCTORAthènes; Greece

  • Source: Microelectronics Reliability ; ESREF 2020, 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-03153075 ; ESREF 2020, 31st European

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Conference

Wire-bond Contact Degradation Modelling for Remaining Useful Lifetime Prognosis of IGBT Power Modules

Subjects: CRACK PROPAGATION; CONTACT RESISTANCE; IGBT SEMICONDUCTORAthènes; Greece

  • Source: Microelectronics Reliability ; ESREF 2020, 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-03153075 ; ESREF 2020, 31st European

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Conference

Wire-bond Contact Degradation Modelling for Remaining Useful Lifetime Prognosis of IGBT Power Modules

Subjects: CRACK PROPAGATION; CONTACT RESISTANCE; IGBT SEMICONDUCTORAthènes; Greece

  • Source: Microelectronics Reliability ; ESREF 2020, 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-03153075 ; ESREF 2020, 31st European

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  • 1-5 ل  5 نتائج ل ""Remaining useful lifetime""