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Conference

On-Line Digital Fine Monitoring of SiC MOSFET Gate-Oxide Health: A Dual-Channel Gate Driving Approach

Subjects: SiC MOSFET; health monitoring; gate driverBremen; Germany

  • Source: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)https://hal.science/hal-046473222024 36th International Symposium on Power Semiconductor Devices and ICs

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Conference

Physical-informed machine learning prediction of properties of oxide glasses

Subjects: glass; machine learning; mechanical propertiesAachen (Aix la Chapelle); Germany

  • Source: 97th Glass-Technology Conferencehttps://minesparis-psl.hal.science/hal-0459162797th Glass-Technology Conference, Dr. Thomas Jüngling, May 2024, Aachen (Aix la Chapelle),

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