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Structural and electronic properties of thin Ni layers on Cu(111) as investigated by ARPES, STM and GIXD

• Authors : Ivana Vobornik; Giorgio Rossi; Jun Fujii ...

Subjects: SURFACE; 0103 physical sciences; COPPER

• Source: Surface science 600 (2006): 3938–3942. doi:10.1016/j.susc.2006.01.104info:cnr-pdr/source/autori:Mulazzi, M; Stanescu, S; Fujii, J; Vobornik, I; Boeglin, C; Belkhou, R; Rossi, G; Barbier,

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Opportunities and new developments for the study of surfaces and interfaces in soft condensed matter at the SIRIUS beamline of Synchrotron SOLEIL.

• Authors : Hemmerle, Arnaud; Aubert, Nicolas; Moreno, Thierry

Subjects: CONDENSED matter; DIFFRACTIVE scattering; SYNCHROTRONS

• Source: Journal of Synchrotron Radiation; Jan2024, Vol. 31 Issue 1, p162-176, 15p

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Implementation of a beam deflection system for studies of liquid interfaces on beamline I07 at Diamond.

• Authors : Arnold, Thomas¹; Nicklin, Chris¹; Rawle, Jonathan¹

• Source: Journal of Synchrotron Radiation. May2012, Vol. 19 Issue 3, p408-416. 9p.

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The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV-CVD and MBE reactor for in situ X-ray scattering investigations of growing nanoparticles and semiconductor nanowires.

• Authors : Cantelli, V.; Geaymond, O.; Ulrich, O.

Subjects: NANOSTRUCTURES; SURFACES (Physics); X-ray scattering

• Source: Journal of Synchrotron Radiation; May2015, Vol. 22 Issue 3, p688-700, 13p

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Step-induced structural modification of Co thin films deposited on Au(2 3 3) vicinal surface

• Authors : BAUDOT, G; GIRARD, Y; REPAIN, V

Subjects: reflection; diffraction; X-ray scattering

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Step interactions on Pt(111) vicinal surfaces determined by grazing incidence X-ray diffraction: Influence of the step orientation

• Authors : Prévot, Geoffroy; Barbier, Luc; Steadman, Paul ...

Subjects: Surface energy; Surface stress; 0103 physical sciences

• Source: Surface ScienceSurface Science, Elsevier, 2010, 604, pp.1265-1272. ⟨10.1016/j.susc.2010.04.012⟩Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces

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High resolution X-ray scattering investigation of Pt/LaF

• Authors : Texture The Laf; The Pennsylvania State University CiteSeerX Archives

Subjects: X-ray scattering; Pt/LaF 3 /Si samples

• Source: http://www.chemie.hu-berlin.de/wmoritz/publications/pdf-files/physicaB.pdf.

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