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Analysis of the Chemical Composition and Structure of Micrometer-Thick Complex Oxide Films: A Case Study of a MgAl2O4 Film on SiO2 Using Electron Probe Microanalysis and Confocal Raman Spectroscopy.

• Authors : Bulatov, V. A.¹ (AUTHOR) ; Shchapova, Yu. V.¹ (AUTHOR); Zamyatin, D. A.¹ (AUTHOR)

Subjects: *ELECTRON probe microanalysis; *ANALYTICAL chemistry; *OXIDE coating

• Source: Journal of Analytical Chemistry. Dec2023, Vol. 78 Issue 12, p1630-1641. 12p.

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Effects of In-Air Post Deposition Annealing Process on the Oxygen Vacancy Content in Sputtered GDC Thin Films Probed via Operando XAS and Raman Spectroscopy

• Authors : Coppola N.; Ur Rehman S.; Carapella G.

Subjects: solid oxide fuel cells; operando XAS; thin films

• Source: ACS Applied Electronic Materials. 6:7135-7144

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Raman Spectroscopy of Silicon-doped Aluminum Nitride Thin Films

• Authors : Fu, Xuke

Subjects: Materials Science; Crystal structure; Doping

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Real‐Time Observation of Oxygen Diffusion in CGO Thin Films Using Spatially Resolved Isotope Exchange Raman Spectroscopy.

• Authors : Stangl, Alexander¹ (AUTHOR) ; Nuns, Nicolas² (AUTHOR); Pirovano, Caroline² (AUTHOR)

• Source: Small Structures. Nov2024, Vol. 5 Issue 11, p1-9. 9p.

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Nanoscale Chemical Analysis of Thin Film Solar Cell Interfaces Using Tip-Enhanced Raman Spectroscopy

• Authors : Bienz S.; Spaggiari G.; Calestani D.

Subjects: solar cell; Solar cells; tip-enhanced Raman spectroscopy

• Source: ACS Appl Mater InterfacesACS Applied Materials & Interfaces, 16 (12)

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INVESTIGATION OF THE ATOMIC DYNAMICS OF CdSe THIN LAYERS BY RAMAN SPECTROSCOPY.

• Authors : Abdullayev, N. M.¹; Ibrahimova, L. N.²; Aliyev, M. E.³

• Source: Chemical Problems / Kimya Problemləri. 2024, Vol. 22 Issue 2, p231-236. 6p.

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Structural changes in As40S60–xSex thin films due to annealing and irradiation: Raman spectroscopy studies.

• Authors : I., Voynarovych¹ ; M., Hopko²; O., Edinak²

• Source: Ukrainian Journal of Physical Optics. 2022, Vol. 23 Issue 3, p133-141. 9p.

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The evolution of total internal reflection Raman spectroscopy for the chemical characterization of thin films and interfaces.

• Authors : Nyamekye, Charles K. A.^1,2 (AUTHOR); Bobbitt, Jonathan M.^1,2 (AUTHOR); Zhu, Qiaochu¹ (AUTHOR)

Subjects: *INTERNAL reflection spectroscopy; *THIN films; *ATTENUATED total reflectance

• Source: Analytical & Bioanalytical Chemistry. Sep2020, Vol. 412 Issue 24, p6009-6022. 14p.

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Measurement of Residual Stress in YBa2Cu3O7−x Thin Films by Raman Spectroscopy.

• Authors : Zhao, Peng¹ (AUTHOR) ; Ouyang, Xiaoping¹ (AUTHOR); Yu, Jingfeng² (AUTHOR)

• Source: Journal of Low Temperature Physics. Feb2021, Vol. 202 Issue 3/4, p382-396. 15p.

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The presence of superoxide ions and related dioxygen species in zinc oxide—A structural characterization by in situ Raman spectroscopy

• Authors : Dieter Fischer; Dejan Zagorac; J. Christian Schön

Subjects: thin films; Raman spectroscopy; 0103 physical sciences

• Source: Journal of Raman Spectroscopy

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