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POx/Al2O3 Stacks for c-Si Surface Passivation: Material and Interface Properties

Subjects: interface properties; Materials science; Passivation

  • Source: ACS applied electronic materials 3(10), 4337-4347 (2021). doi:10.1021/acsaelm.1c00516ACS Applied Electronic Materials, 3(10), 4337-4347. American Chemical SocietyACS Applied Electronic

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