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Academic Journal

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

Subjects: [PHYS]Physics [physics]; Technology; Chemical technology

  • Source: Beilstein J NanotechnolBeilstein Journal of Nanotechnology, Vol 14, Iss 1, Pp 1141-1148 (2023)Beilstein Journal of NanotechnologyBeilstein Journal of Nanotechnology, 2023, 14,

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