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Academic Journal

Single-shot, coherent, pop-out 3D metrology.

  • Source: Communications Physics. 11/4/2023, Vol. 6 Issue 1, p1-15. 15p.

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Academic Journal

Versatile application of a modern scanning electron microscope for materials characterization.

  • Source: Journal of Materials Science. Oct2020, Vol. 55 Issue 28, p13824-13835. 12p. 11 Diagrams, 1 Graph.

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