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Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer.

• Authors : Nakamura, Nathan^1,2 (AUTHOR) ; Szypryt, Paul^1,2 (AUTHOR) ; Dagel, Amber L.³ (AUTHOR)

• Source: Sensors (14248220). May2024, Vol. 24 Issue 9, p2890. 17p.

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A Study of Advancing Ultralow-Power 3D Integrated Circuits with TEI-LP Technology and AI-Enhanced PID Autotuning.

• Authors : Jeon, Sangmin¹ (AUTHOR) ; Kwak, Hyunseok¹ (AUTHOR); Lee, Woojoo¹ (AUTHOR)

• Source: Mathematics (2227-7390). Feb2024, Vol. 12 Issue 4, p543. 19p.

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Invention Of Integrated Circuits: Untold Important Facts

• Authors : Arjun N Saxena

Subjects: Integrated circuits--History; Integrated circuitsSCIENCE / Physics / General

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International journal of design, analysis and tools for integrated circuits and systems. [electronic resource].

Subjects: Integrated circuits -- Periodicals; Integrated circuits; Electronic journals

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Two-dimensional semiconductor transistors and integrated circuits for advanced technology nodes.

• Authors : Li, Weisheng^1,2,3 (AUTHOR); Shen, Haoliang² (AUTHOR) ; Qiu, Hao^1,3 (AUTHOR)

• Source: National Science Review. Mar2024, Vol. 11 Issue 3, p1-3. 3p.

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Materials Quest for Advanced Interconnect Metallization in Integrated Circuits.

• Authors : Moon, Jun Hwan¹ (AUTHOR); Jeong, Eunjin¹ (AUTHOR); Kim, Seunghyun¹ (AUTHOR)

• Source: Advanced Science. 8/15/2023, Vol. 10 Issue 23, p1-30. 30p.

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FAILURE ANALYSIS OF PHOTONIC INTEGRATED CIRCUITS.

• Authors : Baumann, Frieder H.¹ ; Popielarski, Brian¹; Sweeney, Ryan¹

• Source: Electronic Device Failure Analysis. Aug2023, Vol. 25 Issue 3, p23-30. 6p.

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Emerging MoS2 Wafer-Scale Technique for Integrated Circuits.

• Authors : Ye, Zimeng¹ (AUTHOR); Tan, Chao¹ (AUTHOR); Huang, Xiaolei² (AUTHOR)

• Source: Nano-Micro Letters. 1/18/2023, Vol. 15 Issue 1, p1-42. 42p.

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INTELLECTUAL PROPERTY AND SECURITY IN THE INTEGRATED CIRCUITS INDUSTRY.

• Authors : Nachev, Ivan¹, ; Tomova, Yuliana¹, ; Konstantinov, Iskren¹,

• Source: Strategies for Policy in Science & Education / Strategii na Obrazovatelnata i Nauchnata Politika; 2024 Spl Issue, Vol. 32, p71-86, 16p

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Organic transistor‐based integrated circuits for future smart life

• Authors : Yifan Xie; Chenming Ding; Qingqing Jin

Subjects: analytical models; device architectures; digital and analog circuits

• Source: SmartMat, Vol 5, Iss 4, Pp n/a-n/a (2024)

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