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Academic Journal

Characterization of Defects and Stress in Polycrystalline Silicon Thin Films on Glass Substrates by Raman Microscopy.

  • Source: International Journal of Spectroscopy. 2011, p1-14. 14p. 1 Color Photograph, 2 Black and White Photographs, 2 Diagrams, 13 Graphs, 1 Map.

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  • 1-10 ل  136 نتائج ل ""Polycrystalline silicon""