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Conference

On properties of boundaries and electron conductivity in mesoscopic polycrystalline silicon films for memory devices

  • Authors : Nagaev, K [Russian Academy of Sciences, Moscow (Russian Federation). Inst. of Radio-engineering and Electronics]

  • Source: Conference: 2. international workshop on surfaces and interfaces of mesoscopic devices, Kaanapalli, HI (United States), 7-12 Dec 1997; Other Information: PBD: Feb 1998

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