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The Impact of LCE and PAMDLE Regarding Different CMOS ICs Nodes and High Temperatures

• Authors : Salvador Pinillos Gimenez; Christian Renaux; Jacobus W. Swart ...

Subjects: Materials science; High temperature; Transconductance

• Source: IEEE Journal of the Electron Devices Society, Vol 9, Pp 415-423 (2021)I E E E Journal of the Electron Devices Society, Vol. 9, p. 415-423 (2021)

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Quantum efficiency enhancement of germanium-on-insulator photodetectors for integrated photonics on silicon

• Authors : Yiding Lin;

Subjects: Materials science; Silicon; business.industry

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Single-channel recordings of RyR1 at microsecond resolution in CMOS-suspended membranes

• Authors : Indra Schroeder; Andreas J.W. Hartel; Andrew R. Marks

Subjects: 0301 basic medicine; Transimpedance amplifier; Materials science

• Source: Proceedings of the National Academy of Sciences

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Detectability of Breast Tumor by a Hand-held Impulse-Radar Detector: Performance Evaluation and Pilot Clinical Study

• Authors : Takamaro Kikkawa; Shinsuke Sasada; Xia Xiao

Subjects: Diagnostic Imaging; 0206 medical engineering; lcsh:Medicine

• Source: Scientific ReportsScientific Reports, Vol 7, Iss 1, Pp 1-11 (2017)

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Microwave Imaging Using CMOS Integrated Circuits with Rotating 4 × 4 Antenna Array on a Breast Phantom

• Authors : Eiji Suematsu; Hiromasa Watanabe; Hang Song

Subjects: Article Subject; 0206 medical engineering; 02 engineering and technology

• Source: International Journal of Antennas and Propagation, Vol 2017 (2017)

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Application prospect of metal-oxide-semiconductor silicon light emitting devices in integrated circuits

Subjects: Materials science; Silicon; business.industry

• Source: Acta Physica Sinica. 68:167803

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Recent trends and future prospective on millimeter-wave CMOS circuits

• Authors : Minoru Fujishima

Subjects: Engineering; business.industry; ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION

• Source: IEICE Electronics Express. 6:721-735

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Electron-beam-evaporated thin films of hafnium dioxide for fabricating electronic devices

• Authors : Kim Kisslinger; Zhigang Xiao

Subjects: Materials science; Silicon; business.industry

• Source: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 33:042001

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Performance of Digital Integrated Circuit Technologies at Very High Temperatures

• Authors : E. Rapp; J. Prince; B. Draper

Subjects: Engineering; business.industry; General Engineering

• Source: IEEE Transactions on Components, Hybrids, and Manufacturing Technology. 3:571-579

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