Source: French Tech London Quantum Webinar ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025169 ; French Tech London Quantum Webinar, Jun 2020, London, United Kingdom ;

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DE SECNUM : un diplôme d'établissement pour former les experts en systèmes embarqués sécurisés

Authors : Bruguier, Florent; Pradarelli, Béatrice; Torres, Lionel ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsDakar; Senegal

Source: Colloque sur les Objets et Systèmes connectés ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03729120 ; Colloque sur les Objets et Systèmes connectés, May 2022, Dakar, Sénégal

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Characterization of a RISC-V System-on-Chip under Neutron Radiation

Authors : Almeida dos Santos, Douglas; Matana Luza, Lucas; Kastriotou, Maria ...

Subjects: RISC-V; System-on-Chip; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357515 ; DTIS 2021 - 16th International Conference on

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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Authors : Rossi de Melo, Douglas; Zeferino, Cesar Albenes; Bezerra, Eduardo Augusto ...

Subjects: SoC; NoC; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358975 ; DTIS 2021 - 16th International Conference on

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Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Authors : Ammoura, Lila; Flottes, Marie-Lise; Girard, Patrick ...

Subjects: 8T SRAM cell; In-Memory Computing; testMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377433 ; DTIS 2021 - 16th International Conference on

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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Authors : Matana Luza, Lucas; Söderström, Daniel; Mattos, André Martins Pio De ...

Subjects: Neutrons; Radiation Effects; SDRAMMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444 ; DTIS 2021 - 16th International Conference on

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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Authors : Melo, Douglas Rossi; Zeferino, Cesar Albenes; Bezerra, Eduardo Augusto ...

Subjects: [SPI.TRON]Engineering Sciences [physics]/Electronics; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [INFO.INFO-ES]Computer Science [cs]/Embedded SystemsMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal-lirmm.ccsd.cnrs.fr/lirmm-0335897516th International Conference on Design

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Toward New Era of Computing: From Devices to Applications

Authors : Todri-Sanial, Aida;

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier (virtual); France

Source: What’s next in Computing ? ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025126 ; What’s next in Computing ?, Jul 2020, Montpellier (virtual), France ;

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Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam

Authors : Söderström, Daniel; Matana Luza, Lucas; Bosser, Alexandre ...

Subjects: Microbeam; Radiation effects; SDRAMMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03359010 ; RADECS 2019 - 19th European Conference on Radiation and

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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

Authors : Gupta, Viyas; Bosser, Alexandre Louis; Matana Luza, Lucas ...

Subjects: Radiation testing; heavy-ion; NAND FlashMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358989 ; RADECS 2019 - 19th European Conference on Radiation and

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نتائج البحث

فلترة النتائج

Quantum Initiative at the University of Montpellier

DE SECNUM : un diplôme d'établissement pour former les experts en systèmes embarqués sécurisés

Characterization of a RISC-V System-on-Chip under Neutron Radiation

Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Toward New Era of Computing: From Devices to Applications

Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam

Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

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