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  • 1-10 ل  1,538 نتائج ل ""INTEGRATED circuits""

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Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics فلترة بواسطة : كلمات مفتاحية
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Conference

Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSherbrookeSherbrooke, Canada

  • Source: Proceedings of NEWCAS 2024 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS) ; https://hal.univ-grenoble-alpes.fr/hal-04734831 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Jun

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Conference

Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSherbrookeSherbrooke, Canada

  • Source: Proceedings of NEWCAS 2024 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS) ; https://hal.univ-grenoble-alpes.fr/hal-04734831 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Jun

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Conference

Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSherbrookeSherbrooke, Canada

  • Source: Proceedings of NEWCAS 2024 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS) ; https://hal.univ-grenoble-alpes.fr/hal-04734831 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Jun

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Academic Journal

A Survey of Testing Techniques for Approximate Integrated Circuits

Subjects: Approximate computing (AxC); Approximate integrated circuits (AxICs); Circuit faults

  • Source: ISSN: 0018-9219.

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Academic Journal

A Survey of Testing Techniques for Approximate Integrated Circuits

Subjects: Approximate computing (AxC); Approximate integrated circuits (AxICs); Circuit faults

  • Source: ISSN: 0018-9219.

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Conference

Development of SiON-based photonic integrated circuits for the blue/near-UV wavelength range

Subjects: SiON; Integrated Optics; Near UltravioletUniversity of Twente; Enschede; The Netherlands

  • Source: 2023 ProceedingsEuropean Conference on Integrated Opticshttps://hal.science/hal-04652207European Conference on

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Conference

Development of SiON-based photonic integrated circuits for the blue/near-UV wavelength range

Subjects: SiON; Integrated Optics; Near UltravioletUniversity of Twente; Enschede; The Netherlands

  • Source: 2023 ProceedingsEuropean Conference on Integrated Opticshttps://hal.science/hal-04652207European Conference on

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Conference

On the Comparison of Different ATPG approaches for Approximate Integrated Circuits

Subjects: Approximate Computing; Test; ATPGBudapest; Hungary

  • Source: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)DDECS 2018 - 1st International Symposium on Design and

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Conference

Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits

Subjects: Approximate Computing; Testing; ATPGChicago; United States

  • Source: DFT 2018 - 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-02099895 ; DFT 2018 - 31st IEEE International

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Conference

On the Comparison of Different ATPG approaches for Approximate Integrated Circuits

Subjects: Approximate Computing; Test; ATPGBudapest; Hungary

  • Source: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)DDECS 2018 - 1st International Symposium on Design and

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  • 1-10 ل  1,538 نتائج ل ""INTEGRATED circuits""