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  • 1-10 of  15 نتائج ل ""Kastriotou, Maria""

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Subject : [spi.meca.stru]engineering sciences [physics]/mechanics [physics.med-ph]/structural mechanics [physics.class-ph] Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Subject : selectivity Subject : test فلترة بواسطة : مؤلف
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Conference

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Subjects: RISC-V; System-on-Chip; Fault ToleranceAustin; United States

  • Source: DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03833983 ; DFT 2022 - 35th IEEE International

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Conference

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Subjects: RISC-V; System-on-Chip; Fault ToleranceAustin; United States

  • Source: DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03833983 ; DFT 2022 - 35th IEEE International

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Conference

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Subjects: RISC-V; System-on-Chip; Fault ToleranceAustin; United States

  • Source: DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03833983 ; DFT 2022 - 35th IEEE International

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Academic Journal

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Subjects: Approximate methods; Fault injection; Radiation effects

  • Source: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882.

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Academic Journal

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Subjects: Approximate methods; Fault injection; Radiation effects

  • Source: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882.

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Academic Journal

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Subjects: Approximate methods; Fault injection; Radiation effects

  • Source: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882.

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Academic Journal

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Subjects: Approximate methods; Fault injection; Radiation effects

  • Source: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882.

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Academic Journal

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Subjects: Approximate methods; Fault injection; Radiation effects

  • Source: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882.

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Conference

Characterization of a RISC-V System-on-Chip under Neutron Radiation

Subjects: RISC-V; System-on-Chip; Fault ToleranceMontpellier; France

  • Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357515 ; DTIS 2021 - 16th International Conference on

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Conference

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Subjects: Neutrons; Radiation Effects; SDRAMMontpellier; France

  • Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444 ; DTIS 2021 - 16th International Conference on

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  • 1-10 of  15 نتائج ل ""Kastriotou, Maria""