Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request

نتائج البحث

Display Settings
النتائج لكل صفحة: 10
Sort By: Relevance
Filter
  • 1-9 of  9 نتائج ل ""Matsue""

فلترة النتائج

Subject : [spi.meca.stru]engineering sciences [physics]/mechanics [physics.med-ph]/structural mechanics [physics.class-ph] Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Subject : neural stimulation فلترة بواسطة : موضوع
إعادة تعيين خيارات الفبترة
Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request
Conference

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Subjects: Radiation hardening; Fault tolerance; Multiplenode upsetMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Subjects: Radiation hardening; Latch reliability; Soft errorMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Subjects: Radiation; Circuit reliability; Sensitive nodeMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Subjects: Radiation hardening; Fault tolerance; Multiplenode upsetMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Subjects: Radiation; Circuit reliability; Sensitive nodeMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Subjects: Radiation hardening; Latch reliability; Soft errorMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Subjects: Radiation hardening; Fault tolerance; Multiplenode upsetMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Subjects: Radiation; Circuit reliability; Sensitive nodeMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Subjects: Radiation hardening; Latch reliability; Soft errorMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
  • 1-9 of  9 نتائج ل ""Matsue""