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  • 1-10 of  508 نتائج ل ""Girard, Patrick""

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Subject : [spi.meca.stru]engineering sciences [physics]/mechanics [physics.med-ph]/structural mechanics [physics.class-ph] Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Subject : neural stimulation فلترة بواسطة : مؤلف
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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Book

Cell-Aware Model Generation Using Machine Learning

Subjects: Intra-cell defects; Cell-aware models; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986553 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.227-257, 2023,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Conference

High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology

Subjects: Radiation hardening; Latch reliability; Soft errorAntwerp; Belgium

  • Source: DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240330 ; DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition, Apr

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Conference

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Subjects: Radiation hardening; Fault tolerance; Multiplenode upsetMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

MCTHSL: 4×4-Device-Matrix-Based Cost-Optimized TNU-Recovery HIS-Insensitive and SET-Filterable Latch for Aerospace Applications

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSan Francisco; United States

  • Source: DAC 2023 - ACM/EDAA Design Automation Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240386 ; DAC 2023 - ACM/EDAA Design Automation Conference, Jul 2023, San Francisco, United States

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Conference

A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications

Subjects: Circuit reliability; Radiation hardening; Soft errorKnoxville; TN; United States

  • Source: GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241408 ; GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI, Jun 2023, Knoxville,

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Conference

Predictor BIST: An 'All-in-One' Optical Test Solution for CMOS Image Sensors

Subjects: CMOS image sensor; BIST; Optical testAnaheim; United States

  • Source: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States

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  • 1-10 of  508 نتائج ل ""Girard, Patrick""