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  • 1-50 of  509 نتائج ل ""Girard, Patrick""

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Subject : [spi.meca.stru]engineering sciences [physics]/mechanics [physics.med-ph]/structural mechanics [physics.class-ph] Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Subject : neural stimulation فلترة بواسطة : مؤلف
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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Conference

Analysis of Resistive-Open Defects on a Foundry 8T SRAM-based IMC Architecture

Subjects: In-Memory Computing; 8T SRAM cell; Resistiveopen defectLyon; France

  • Source: 17e Colloque National du GDR SoC²https://hal-lirmm.ccsd.cnrs.fr/lirmm-0456568817e Colloque National du GDR SoC², Jun 2023, Lyon, France

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Book

Cell-Aware Model Generation Using Machine Learning

Subjects: Intra-cell defects; Cell-aware models; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986553 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.227-257, 2023,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Conference

High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology

Subjects: Radiation hardening; Latch reliability; Soft errorAntwerp; Belgium

  • Source: DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240330 ; DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition, Apr

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Conference

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Subjects: Radiation hardening; Fault tolerance; Multiplenode upsetMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

MCTHSL: 4×4-Device-Matrix-Based Cost-Optimized TNU-Recovery HIS-Insensitive and SET-Filterable Latch for Aerospace Applications

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSan Francisco; United States

  • Source: DAC 2023 - ACM/EDAA Design Automation Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240386 ; DAC 2023 - ACM/EDAA Design Automation Conference, Jul 2023, San Francisco, United States

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Conference

A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications

Subjects: Circuit reliability; Radiation hardening; Soft errorKnoxville; TN; United States

  • Source: GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241408 ; GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI, Jun 2023, Knoxville,

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Conference

Predictor BIST: An 'All-in-One' Optical Test Solution for CMOS Image Sensors

Subjects: CMOS image sensor; BIST; Optical testAnaheim; United States

  • Source: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States

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Conference

A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Subjects: Radiation hardening; Latch reliability; Soft errorMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Subjects: Radiation; Circuit reliability; Sensitive nodeMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

Design of Low-Cost Approximate CMOS Full Adders

Subjects: Approximate calculation; Approximate full adder; Data processingMonterey; CA; United States

  • Source: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Book

Cell-Aware Model Generation Using Machine Learning

Subjects: Intra-cell defects; Cell-aware models; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986553 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.227-257, 2023,

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Conference

High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology

Subjects: Radiation hardening; Latch reliability; Soft errorAntwerp; Belgium

  • Source: DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240330 ; DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition, Apr

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Conference

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Subjects: Radiation hardening; Fault tolerance; Multiplenode upsetMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

Predictor BIST: An 'All-in-One' Optical Test Solution for CMOS Image Sensors

Subjects: CMOS image sensor; BIST; Optical testAnaheim; United States

  • Source: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States

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Conference

Design of Low-Cost Approximate CMOS Full Adders

Subjects: Approximate calculation; Approximate full adder; Data processingMonterey; CA; United States

  • Source: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023,

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Conference

Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Subjects: Radiation; Circuit reliability; Sensitive nodeMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Subjects: Radiation hardening; Latch reliability; Soft errorMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

MCTHSL: 4×4-Device-Matrix-Based Cost-Optimized TNU-Recovery HIS-Insensitive and SET-Filterable Latch for Aerospace Applications

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSan Francisco; United States

  • Source: DAC 2023 - ACM/EDAA Design Automation Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240386 ; DAC 2023 - ACM/EDAA Design Automation Conference, Jul 2023, San Francisco, United States

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Conference

A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications

Subjects: Circuit reliability; Radiation hardening; Soft errorKnoxville; TN; United States

  • Source: GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241408 ; GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI, Jun 2023, Knoxville,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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اقرأ أكثر حفظ في قائمتي
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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Conference

High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology

Subjects: Radiation hardening; Latch reliability; Soft errorAntwerp; Belgium

  • Source: DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240330 ; DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition, Apr

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Conference

MCTHSL: 4×4-Device-Matrix-Based Cost-Optimized TNU-Recovery HIS-Insensitive and SET-Filterable Latch for Aerospace Applications

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSan Francisco; United States

  • Source: DAC 2023 - ACM/EDAA Design Automation Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240386 ; DAC 2023 - ACM/EDAA Design Automation Conference, Jul 2023, San Francisco, United States

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Conference

Predictor BIST: An 'All-in-One' Optical Test Solution for CMOS Image Sensors

Subjects: CMOS image sensor; BIST; Optical testAnaheim; United States

  • Source: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States

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Conference

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Subjects: Radiation hardening; Fault tolerance; Multiplenode upsetMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Subjects: Radiation; Circuit reliability; Sensitive nodeMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Subjects: Radiation hardening; Latch reliability; Soft errorMatsue; Japan

  • Source: ITC-Asia 2023 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214 ; ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan

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Conference

A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications

Subjects: Circuit reliability; Radiation hardening; Soft errorKnoxville; TN; United States

  • Source: GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241408 ; GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI, Jun 2023, Knoxville,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Book

Cell-Aware Model Generation Using Machine Learning

Subjects: Intra-cell defects; Cell-aware models; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986553 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.227-257, 2023,

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Book

Defect Diagnosis Techniques for Silicon Customer Returns

Subjects: Diagnosis; Cell-aware test and diagnosis; Machine learning

  • Source: Frontiers of Quality Electronic Design (QED) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03986615 ; Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023,

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Academic Journal

Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture

Subjects: In-Memory Computing; 8T SRAM cell; Resistive defect analysis

  • Source: ISSN: 0026-2714.

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Academic Journal

Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications

Subjects: Radiation hardening; Flip-flop; Soft error

  • Source: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239309 ; IEEE Transactions on Emerging Topics in Computing, 2023, 11 (4), pp.1070-1081.

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Academic Journal

LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments

Subjects: Latch design; Algorithm-based verification; Fault tolerance

  • Source: ISSN: 0278-0070 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770056 ; IEEE Transactions on Computer-Aided Design of

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Academic Journal

A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications

Subjects: Radiation protection; Circuit hardening; Flip-flop reliability

  • Source: ISSN: 2168-2356 ; IEEE Design & Test ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04236363 ; IEEE Design & Test, 2023, 40 (4), pp.34-41. ⟨10.1109/MDAT.2023.3267747⟩.

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Academic Journal

Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments

Subjects: Circuit reliability; latch design; Quadruple Node Upset (QNU)

  • Source: ISSN: 0018-9251 ; IEEE Transactions on Aerospace and Electronic Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04236216 ; IEEE Transactions on Aerospace and Electronic Systems, 2023, 59 (3),

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Academic Journal

Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications

Subjects: Static-random-access memory; Hardening; Node-upset recovery

  • Source: ISSN: 0026-2692 ; Microelectronics Journal ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239447 ; Microelectronics Journal, 2023, 139, pp.105908. ⟨10.1016/j.mejo.2023.105908⟩.

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Academic Journal

Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata

Subjects: Quantum-dot cellular automata; Excess-3 code; BCD adder

  • Source: ISSN: 1549-7747 ; EISSN: 1558-3791.

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Academic Journal

Designs of Array Multipliers with an Optimized Delay in Quantum-Dot Cellular Automata

Subjects: QCA; Array multiplier; XOR gate

  • Source: ISSN: 2079-9292 ; Electronics ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239247 ; Electronics, 2023, 12 (14), pp.3189. ⟨10.3390/electronics12143189⟩.

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Academic Journal

Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture

Subjects: In-Memory Computing; 8T SRAM cell; Resistive defect analysis

  • Source: ISSN: 0026-2714.

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Academic Journal

LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments

Subjects: Latch design; Algorithm-based verification; Fault tolerance

  • Source: ISSN: 0278-0070 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770056 ; IEEE Transactions on Computer-Aided Design of

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Academic Journal

Designs of Array Multipliers with an Optimized Delay in Quantum-Dot Cellular Automata

Subjects: QCA; Array multiplier; XOR gate

  • Source: ISSN: 2079-9292 ; Electronics ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239247 ; Electronics, 2023, 12 (14), pp.3189. ⟨10.3390/electronics12143189⟩.

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Academic Journal

Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments

Subjects: Circuit reliability; latch design; Quadruple Node Upset (QNU)

  • Source: ISSN: 0018-9251 ; IEEE Transactions on Aerospace and Electronic Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04236216 ; IEEE Transactions on Aerospace and Electronic Systems, 2023, 59 (3),

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  • 1-50 of  509 نتائج ل ""Girard, Patrick""