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Conference

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Subjects: Neutrons; Radiation effects; SoftwareFrascati; Italy

  • Source: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736 ; DFT 2020 - 33rd IEEE International

تفاصيل العنوان

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Conference

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Subjects: Neutrons; Radiation effects; SoftwareFrascati; Italy

  • Source: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736 ; DFT 2020 - 33rd IEEE International

تفاصيل العنوان

×
Conference

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Subjects: Neutrons; Radiation effects; SoftwareFrascati; Italy

  • Source: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736 ; DFT 2020 - 33rd IEEE International

تفاصيل العنوان

×
Conference

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Subjects: Neutrons; Radiation effects; SoftwareFrascati; Italy

  • Source: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736 ; DFT 2020 - 33rd IEEE International

تفاصيل العنوان

×
Conference

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Subjects: Neutrons; Radiation effects; SoftwareFrascati; Italy

  • Source: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736 ; DFT 2020 - 33rd IEEE International

تفاصيل العنوان

×
Conference

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Subjects: Neutrons; Radiation effects; SoftwareFrascati; Italy

  • Source: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736 ; IEEE International Symposium on Defect and

تفاصيل العنوان

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