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Conference

Power Analysis Attack Against post-SAT Logic Locking schemes

Authors : Riadi, Nassim; Bruguier, Florent; Benoit, Pascal ...

Subjects: Trust; Logic Locking; Differential Power AnalysisThe Hague; Netherlands

Source: ETS 2024 - 29th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04628663 ; ETS 2024 - 29th IEEE European Test Symposium, May 2024, The Hague, Netherlands. pp.1-6,

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Conference

Logic Locking: Exploration of a new key-gate based on tristate logic

Authors : Dupuis, Sophie; Riadi, Nassim; Moroukian, Clémy ...

Subjects: Hardware trust; Design-for-Trust; Logic lockingBrazilMaceio, Brazil

Source: 25th IEEE Latin American Test Symposium, LATS 2024LATS 2024 - 25th IEEE Latin American Test Symposiumhttps://hal-lirmm.ccsd.cnrs.fr/lirmm-04564164LATS 2024 - 25th IEEE Latin American

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Academic Journal

Multi-Micro-Sensor Platform for Monitoring Toxic Algal Blooms and Pollution in Coastal Marine Waters: Transducer Integration in Micro-Technology

Authors : Groc, Pierre; Cathébras, Guy; Kerzérho, Vincent ...

Subjects: ISFET sensor multisensory in situ; ISFET sensor; Multisensory

Source: ISSN: 2504-3900 ; Proceedings ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04612308 ; Proceedings, 2024, 97 (1), pp.94. ⟨10.3390/proceedings2024097094⟩ ; https://www.mdpi.com/2504-3900/97/1/94.

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Academic Journal

A Power-Efficient High-Drive Current Mirror Combining a Regulated Cascode Topology with a Non-Linear CCII-Based Feedback

Authors : Julien, Mohan; Bernard, Serge; Soulier, Fabien ...

Subjects: CMOS analog design; Current mirror; Current conveyor

Source: ISSN: 2079-9292 ; Electronics ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04612154 ; Electronics, 2024, 13 (8), pp.1556. ⟨10.3390/electronics13081556⟩.

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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Authors : Yan, Aibin; Wang, Litao; Cui, Jie ...

Subjects: MTJ; Fault tolerance; Radiation hardening

Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Conference

Analysis of Resistive-Open Defects on a Foundry 8T SRAM-based IMC Architecture

Authors : Ammoura, Lila; Flottes, Marie-Lise; Girard, Patrick ...

Subjects: In-Memory Computing; 8T SRAM cell; Resistiveopen defectLyon; France

Source: 17e Colloque National du GDR SoC²https://hal-lirmm.ccsd.cnrs.fr/lirmm-0456568817e Colloque National du GDR SoC², Jun 2023,

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Conference

SiC MOSFET micro-explosion due to a single event burnout: analysis at the device and die levels

Authors : Germanicus, Rosine Coq; Phulpin, Tanguy; Rogaume, Thomas ...

Subjects: [PHYS]Physics [physics]; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsPhoenix; United States

Source: ISTFA 2023: Proceedings of the 49th International Symposium for Testing and Failure Analysis Conference ; ISTFA 2023 - the 49th International Symposium for Testing and Failure Analysis Conference ;

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Conference

Logic-Locking schemes and side channel attacks resilience

Authors : Riadi, Nassim; Bruguier, Florent; Benoit, Pascal ...

Subjects: Logic Locking; Design For Trust; Side Channel AttacksTallinn / Virtual; EstoniaTallinn / Virtual, Estonia

Source: SAFEST Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04526269 ; SAFEST Workshop, Jun 2023, Tallinn / Virtual, Estonia. ⟨10.1007/978-3-030-15334-2.4⟩

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Conference

First Step Towards a Fully-Miniaturized Intra-Body Communication Transceiver Based on Galvanic Coupling

Authors : Pitou, Stéphane; Rouyer, Tristan; Bonhommeau, Sylvain ...

Subjects: Body area network; Galvanic coupling; Intra-body communicationSan Francisco (Virtual); United States

Source: FICC 2023 - Future of Information and Communication Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03866901 ; FICC 2023 - Future of Information and Communication Conference, Mar 2023, San Francisco

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Conference

Single-Event Effects Testing with a Laser Beam - Guidelines

Authors : Pouget, Vincent;

Subjects: [SPI.TRON]Engineering Sciences [physics]/Electronics; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsNoordwijk; Netherlands

Source: ESA TEC-QEC Final Presentation days ; https://hal.science/hal-04308725 ; ESA TEC-QEC Final Presentation days, ESA, Jun 2023, Noordwijk, Netherlands

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نتائج البحث

فلترة النتائج

Power Analysis Attack Against post-SAT Logic Locking schemes

Logic Locking: Exploration of a new key-gate based on tristate logic

Multi-Micro-Sensor Platform for Monitoring Toxic Algal Blooms and Pollution in Coastal Marine Waters: Transducer Integration in Micro-Technology

A Power-Efficient High-Drive Current Mirror Combining a Regulated Cascode Topology with a Non-Linear CCII-Based Feedback

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Analysis of Resistive-Open Defects on a Foundry 8T SRAM-based IMC Architecture

SiC MOSFET micro-explosion due to a single event burnout: analysis at the device and die levels

Logic-Locking schemes and side channel attacks resilience

First Step Towards a Fully-Miniaturized Intra-Body Communication Transceiver Based on Galvanic Coupling

Single-Event Effects Testing with a Laser Beam - Guidelines

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