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  • 1-10 of  12 نتائج ل ""Montpellier""

فلترة النتائج

Subject : [spi.elec]engineering sciences [physics]/electromagnetism Subject : [spi.meca.stru]engineering sciences [physics]/mechanics [physics.med-ph]/structural mechanics [physics.class-ph] Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Geographic : la grande motte فلترة بواسطة : موضوع
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Conference

ANC-Based Method for Testing Converters with Random-Phase Harmonics

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494578 ; IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test

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Conference

Adaptive LUT-Based System for In Situ ADC Auto-correction

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494424 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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Conference

Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective Accelerometers

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494555 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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Conference

Smart Drivers for Online Diagnosis of Electrostatic MEMS Actuators

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494515 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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Conference

Adaptive LUT-Based System for In Situ ADC Auto-correction

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494424 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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Conference

Smart Drivers for Online Diagnosis of Electrostatic MEMS Actuators

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494515 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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Conference

Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective Accelerometers

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494555 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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Conference

ANC-Based Method for Testing Converters with Random-Phase Harmonics

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494578 ; IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test

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Conference

Adaptive LUT-Based System for In Situ ADC Auto-correction

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494424 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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Conference

Smart Drivers for Online Diagnosis of Electrostatic MEMS Actuators

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsLa Grande Motte; Montpellier; France

  • Source: IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00494515 ; IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and

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  • 1-10 of  12 نتائج ل ""Montpellier""