Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.science/hal-035023612021 16th International Conference on Design &

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Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology

Authors : Gay, Romeric; Marca, Vincenzo Della; Aziza, Hassen ...

Subjects: Multi-gate; Triple gate transistor; Dual gate transistorMontpellier; France

Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.science/hal-035023602021 16th International Conference on Design &

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Conference

A 270 Hz, Fine Frequency Tuning Class-C Oscillator Using Capacitive--Inductive Degeneration Technique in 130nm CMOS

Authors : Saad, Sehmi; Haddad, Fayrouz.; Hammadi, Aymen Ben ...

Subjects: Capacitive-Inductive Degeneration Coupling; Class-C oscillator; LC-VCOMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal.science/hal-0360191516th International Conference on Design & Technology

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Characterization of a RISC-V System-on-Chip under Neutron Radiation

Authors : Almeida dos Santos, Douglas; Matana Luza, Lucas; Kastriotou, Maria ...

Subjects: RISC-V; System-on-Chip; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357515 ; DTIS 2021 - 16th International Conference on

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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Authors : Rossi de Melo, Douglas; Zeferino, Cesar Albenes; Bezerra, Eduardo Augusto ...

Subjects: SoC; NoC; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358975 ; DTIS 2021 - 16th International Conference on

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Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Authors : Ammoura, Lila; Flottes, Marie-Lise; Girard, Patrick ...

Subjects: 8T SRAM cell; In-Memory Computing; testMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377433 ; DTIS 2021 - 16th International Conference on

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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Authors : Matana Luza, Lucas; Söderström, Daniel; Mattos, André Martins Pio De ...

Subjects: Neutrons; Radiation Effects; SDRAMMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444 ; DTIS 2021 - 16th International Conference on

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Design Space Exploration Applied to Security

Authors : Linarès, Antoine; Hely, David; Lhermet, F. ...

Subjects: PACS: 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal.science/hal-0335194816th International Conference on Design & Technology

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Circuit-level evaluation of a new zero-cost transistor in a embedded non-volatile memory CMOS technology

Authors : Devoge, Paul; Aziza, Hassen; Lorenzini, Philippe ...

Subjects: zero-cost; analog; ring oscillatorMontpellier; France

Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.science/hal-035023612021 16th International Conference on Design &

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Conference

Circuit-level evaluation of a new zero-cost transistor in a embedded non-volatile memory CMOS technology

Authors : Devoge, Paul; Aziza, Hassen; Lorenzini, Philippe ...

Subjects: zero-cost; analog; ring oscillatorMontpellier; France

Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.science/hal-035023612021 16th International Conference on Design &

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Conference

Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology

Authors : Gay, Romeric; Marca, Vincenzo Della; Aziza, Hassen ...

Subjects: Multi-gate; Triple gate transistor; Dual gate transistorMontpellier; France

Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.science/hal-035023602021 16th International Conference on Design &

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Conference

A 270 Hz, Fine Frequency Tuning Class-C Oscillator Using Capacitive--Inductive Degeneration Technique in 130nm CMOS

Authors : Saad, Sehmi; Haddad, Fayrouz.; Hammadi, Aymen Ben ...

Subjects: Capacitive-Inductive Degeneration Coupling; Class-C oscillator; LC-VCOMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal.science/hal-0360191516th International Conference on Design & Technology

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Conference

A 270 Hz, Fine Frequency Tuning Class-C Oscillator Using Capacitive--Inductive Degeneration Technique in 130nm CMOS

Authors : Saad, Sehmi; Haddad, Fayrouz.; Hammadi, Aymen Ben ...

Subjects: Capacitive-Inductive Degeneration Coupling; Class-C oscillator; LC-VCOMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal.science/hal-0360191516th International Conference on Design & Technology

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Etude de sensibilité des paramètres descriptifs du comportement d'une structure ancienne en bois : la halle de Villeréal

Authors : Tevi, Komlan, Renaud; Elachachi, Sidi, Mohammed; Cointe, Alain ...

Subjects: [SPI.MECA.STRU]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Structural mechanics [physics.class-ph]; [SPI.MECA]Engineering Sciences [physics]/Mechanics [physics.med-ph]Montpellier; France

Source: 10èmes Journées Scientifiques du GDR 3544 "Sciences du bois"https://hal.science/hal-0378140610èmes Journées Scientifiques du GDR 3544 "Sciences du bois", Nov 2021,

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Conference

Characterization of a RISC-V System-on-Chip under Neutron Radiation

Authors : Almeida dos Santos, Douglas; Matana Luza, Lucas; Kastriotou, Maria ...

Subjects: RISC-V; System-on-Chip; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357515 ; DTIS 2021 - 16th International Conference on

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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Authors : Rossi de Melo, Douglas; Zeferino, Cesar Albenes; Bezerra, Eduardo Augusto ...

Subjects: SoC; NoC; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358975 ; DTIS 2021 - 16th International Conference on

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Conference

Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Authors : Ammoura, Lila; Flottes, Marie-Lise; Girard, Patrick ...

Subjects: 8T SRAM cell; In-Memory Computing; testMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377433 ; DTIS 2021 - 16th International Conference on

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Etude de sensibilité des paramètres descriptifs du comportement d'une structure ancienne en bois : la halle de Villeréal

Authors : Tevi, Komlan, Renaud; Elachachi, Sidi, Mohammed; Cointe, Alain ...

Source: 10èmes Journées Scientifiques du GDR 3544 "Sciences du bois"https://hal.science/hal-0378140610èmes Journées Scientifiques du GDR 3544 "Sciences du bois", Nov 2021,

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Conference

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Authors : Matana Luza, Lucas; Söderström, Daniel; Mattos, André Martins Pio De ...

Subjects: Neutrons; Radiation Effects; SDRAMMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444 ; DTIS 2021 - 16th International Conference on

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Conference

Etude de sensibilité des paramètres descriptifs du comportement d'une structure ancienne en bois : la halle de Villeréal

Authors : Tevi, Komlan, Renaud; Elachachi, Sidi, Mohammed; Cointe, Alain ...

Source: 10èmes Journées Scientifiques du GDR 3544 "Sciences du bois"https://hal.science/hal-0378140610èmes Journées Scientifiques du GDR 3544 "Sciences du bois", Nov 2021,

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Conference

A 270 Hz, Fine Frequency Tuning Class-C Oscillator Using Capacitive--Inductive Degeneration Technique in 130nm CMOS

Authors : Saad, Sehmi; Haddad, Fayrouz.; Hammadi, Aymen Ben ...

Subjects: Capacitive-Inductive Degeneration Coupling; Class-C oscillator; LC-VCOMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal.science/hal-0360191516th International Conference on Design & Technology

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Conference

Circuit-level evaluation of a new zero-cost transistor in a embedded non-volatile memory CMOS technology

Authors : Devoge, Paul; Aziza, Hassen; Lorenzini, Philippe ...

Subjects: transistor; MOSFET; CMOSMontpellier; France

Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.archives-ouvertes.fr/hal-035023612021 16th International Conference on

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Conference

Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology

Authors : Gay, Romeric; Marca, Vincenzo Della; Aziza, Hassen ...

Subjects: Multi-gate; Triple gate transistor; Dual gate transistorMontpellier; France

Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.archives-ouvertes.fr/hal-035023602021 16th International Conference on

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Conference

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Authors : Matana Luza, Lucas; Söderström, Daniel; Mattos, André Martins Pio de ...

Subjects: Neutrons; Radiation Effects; SDRAMMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal-lirmm.ccsd.cnrs.fr/lirmm-0335744416th International Conference on Design

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Conference

Characterization of a RISC-V System-on-Chip under Neutron Radiation

Authors : Almeida dos Santos, Douglas; Matana Luza, Lucas; Kastriotou, Maria ...

Subjects: RISC-V; System-on-Chip; Fault ToleranceMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal-lirmm.ccsd.cnrs.fr/lirmm-0335751516th International Conference on Design

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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Authors : Melo, Douglas Rossi; Zeferino, Cesar Albenes; Bezerra, Eduardo Augusto ...

Subjects: [SPI.TRON]Engineering Sciences [physics]/Electronics; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [INFO.INFO-ES]Computer Science [cs]/Embedded SystemsMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal-lirmm.ccsd.cnrs.fr/lirmm-0335897516th International Conference on Design

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Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Authors : Ammoura, Lila; Flottes, Marie-Lise; Girard, Patrick ...

Subjects: 8T SRAM cell; In-Memory Computing; testMontpellier; France

Source: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)https://hal-lirmm.ccsd.cnrs.fr/lirmm-0337743316th International Conference on Design

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Conference

Etude de sensibilité des paramètres descriptifs du comportement d'une structure ancienne en bois : la halle de Villeréal

Authors : Tevi, Komlan, Renaud; Elachachi, Sidi, Mohammed; Cointe, Alain ...

Source: 10èmes Journées Scientifiques du GDR 3544 "Sciences du bois"https://hal.science/hal-0378140610èmes Journées Scientifiques du GDR 3544 "Sciences du bois", Nov 2021,

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Toward New Era of Computing: From Devices to Applications

Authors : Todri-Sanial, Aida;

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier (virtual); France

Source: What’s next in Computing ? ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025126 ; What’s next in Computing ?, Jul 2020, Montpellier (virtual), France ;

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Toward New Era of Computing: From Devices to Applications

Authors : Todri-Sanial, Aida;

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier (virtual); France

Source: What’s next in Computing ? ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025126 ; What’s next in Computing ?, Jul 2020, Montpellier (virtual), France ;

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Toward New Era of Computing: From Devices to Applications

Authors : Todri-Sanial, Aida;

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier (virtual); France

Source: What’s next in Computing ? ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025126 ; What’s next in Computing ?, Jul 2020, Montpellier (virtual), France ;

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Développement technologique d'un HEMT normally-off avec une grille à barrière P-GaN

Authors : Haloui, Chaymaa; Tasselli, Josiane; Isoird, Karine ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM) ; https://laas.hal.science/hal-02278808 ; Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun

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Matrice de Butler 3D compacte et large bande pour applications 5G

Authors : Cayron, Audrey; Viallon, Christophe; Ghannam, Ayad ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.ELEC]Engineering Sciences [physics]/ElectromagnetismMontpellier; France

Source: Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019) ; https://laas.hal.science/hal-03058268 ; Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun

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Optimisation des techniques de microfabrication sur diamant

Authors : Fontaine, Lya; Isoird, Karine; Tasselli, Josiane ...

Subjects: [SHS]Humanities and Social Sciences; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.MAT]Engineering Sciences [physics]/MaterialsMontpellier; France

Source: Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019) ; https://shs.hal.science/halshs-02329822 ; Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM

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Conference

Développement technologique d'un HEMT normally-off avec une grille à barrière P-GaN

Authors : Haloui, Chaymaa; Tasselli, Josiane; Isoird, Karine ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM) ; https://laas.hal.science/hal-02278808 ; Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun

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Matrice de Butler 3D compacte et large bande pour applications 5G

Authors : Cayron, Audrey; Viallon, Christophe; Ghannam, Ayad ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.ELEC]Engineering Sciences [physics]/ElectromagnetismMontpellier; France

Source: Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019) ; https://laas.hal.science/hal-03058268 ; Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun

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Optimisation des techniques de microfabrication sur diamant

Authors : Fontaine, Lya; Isoird, Karine; Tasselli, Josiane ...

Source: Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019) ; https://shs.hal.science/halshs-02329822 ; Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM

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Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam

Authors : Söderström, Daniel; Matana Luza, Lucas; Bosser, Alexandre ...

Subjects: Microbeam; Radiation effects; SDRAMMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03359010 ; RADECS 2019 - 19th European Conference on Radiation and

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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

Authors : Gupta, Viyas; Bosser, Alexandre Louis; Matana Luza, Lucas ...

Subjects: Radiation testing; heavy-ion; NAND FlashMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358989 ; RADECS 2019 - 19th European Conference on Radiation and

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Self-robust Non-Volatile C-element for single event upset enhanced tolerance

Authors : Coi, Odilia; Torres, Lionel; Di Pendina, Gregory ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957093 ; RADECS 2019 - 19th European Conference on Radiation and

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Self-Robust Non-Volatile C-element for Single Event Upset Enhanced Tolerance

Authors : Coi, Odilia; Torres, Lionel; Di Pendina, Gregory ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: JNRDM 2019 - 21es Journées Nationales du Réseau Doctoral en Micro-nanoélectronique ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-02366116 ; JNRDM 2019 - 21es Journées Nationales du Réseau Doctoral en

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The use of ensemble methods for indirect test of RF circuits

Authors : El Badawi, Hassan; Azaïs, Florence; Bernard, Serge ...

Subjects: indirect testing; RF integrated circuits; machine-learning algorithmsMontpellier; France

Source: 13e Colloque National du GDR SOC²https://hal-lirmm.ccsd.cnrs.fr/lirmm-0237590013e Colloque National du GDR SOC², Jun 2019, Montpellier, France

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Evaluation of embedded STT-MRAM for Ultra Low Power applications

Authors : Patrigeon, Guillaume; Benoit, Pascal; Torres, Lionel ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: 13e Colloque National du GDR SoC²https://hal-lirmm.ccsd.cnrs.fr/lirmm-0237970313e Colloque National du GDR SoC², Jun 2019, Montpellier, France. , 2019

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Static linearity test of SAR ADCs using an embedded incremental Σ∆ converter

Authors : Silveira Feitoza, R.; Barragan, Manuel J.; Dzahini, Daniel ...

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019) ; https://hal.science/hal-02193107 ; Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019),

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Assessment of Current Sensor on Chip for Detecting Neutron-Induced Transients via Body Terminals

Authors : Possamai Bastos, Rodrigo; Dutertre, Jean-Max; Garay Trindade, Matheus ...

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: Conference on Radiation Effects on Components and Systems (RADECS 2019) ; https://hal.science/hal-02299066 ; Conference on Radiation Effects on Components and Systems (RADECS 2019), Sep 2019,

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Conference

Self-Robust Non-Volatile C-element for Single Event Upset Enhanced Tolerance

Authors : Coi, Odilia; Torres, Lionel; Di Pendina, Gregory ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: JNRDM 2019 - 21es Journées Nationales du Réseau Doctoral en Micro-nanoélectronique ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-02366116 ; JNRDM 2019 - 21es Journées Nationales du Réseau Doctoral en

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LearnV: A Hardware/Software RISC V Based platform for Research and Education

Authors : Ait Said, N.; Benabdenbi, Mounir;

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: Colloque National du GDR SoC2 2019 ; https://hal.science/hal-02614531 ; Colloque National du GDR SoC2 2019, Jun 2019, Montpellier, France

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On the reliability of Support Vector Machines

Authors : Garay Trindade, Matheus; Possamai Bastos, Rodrigo;

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019)https://hal.science/hal-0310054921èmes Journées Nationales du Réseau Doctoral en Microélectronique

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Exploring a Non-conventional Testing Technique for Asynchronous Circuits

Authors : Aquino Guazzelli, R.; Garay Trindade, Matheus; Fesquet, Laurent ...

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019)https://hal.science/hal-0310056021èmes Journées Nationales du Réseau Doctoral en Microélectronique

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Self-robust Non-Volatile C-element for single event upset enhanced tolerance

Authors : Coi, Odilia; Torres, Lionel; Di Pendina, Gregory ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957093 ; RADECS 2019 - 19th European Conference on Radiation and

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