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Conference

Characterization of Multilayer Structures by Acoustic Microscopy

Subjects: Acoustic microscopy; Thin layer characterization; Non destructive EvaluationSingapore

  • Source: 5th International Conference on Materials Science and Engineering Technologyhttps://hal.science/hal-044722775th International Conference on Materials Science and Engineering Technology,

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Conference

Design and optimisation of XUV multilayer mirrors for FEL and Synchrotron Radiation facilities

Subjects: XUV multilayer mirrors; FEL; synchrotron radiationTrieste; Italy

  • Source: FUSEE (FUture of SEeded free Electron lasers) ; https://hal.science/hal-04548980 ; FUSEE (FUture of SEeded free Electron lasers), Dec 2019, Trieste, Italy

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Conference

Design and optimisation of XUV multilayer mirrors for FEL and Synchrotron Radiation facilities

Subjects: XUV multilayer mirrors; FEL; synchrotron radiationTrieste; Italy

  • Source: FUSEE (FUture of SEeded free Electron lasers) ; https://hal.science/hal-04548980 ; FUSEE (FUture of SEeded free Electron lasers), Dec 2019, Trieste, Italy

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  • 1-10 ل  410 نتائج ل ""Multilayer""