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Auger, zero-energy photoelectron, coincidence spectroscopy (AZEPECO): Chemical-site-selective Auger electron spectroscopy

• Authors : Kuiper, P [Brookhaven National Lab., Upton, NY (United States). Physics Dept.]

• Source: Conference: Synchrotron radiation instrumentation,Gaithersburg, MD (United States),23-26 Aug 1993; Other Information: PBD: [1993]

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Using X-ray induced Auger electron spectroscopy transitions to explore the surface reactivity of CIGS: In and Ga degradation kinetics at different probing depths

• Authors : Gagliardi, Anna; Fairley, Neal; Béchu, Solène ...

Subjects: [CHIM]Chemical SciencesGoteborg; Sweden

• Source: ECASIA 2024 ; https://hal.science/hal-04907705 ; ECASIA 2024, Jun 2024, Goteborg, Sweden

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Electron Probe Microanalyses in Auger Electron Spectroscopy.

• Authors : Spasov, Georgi Spasov^1,2

• Source: Annual Journal of Electronics. 2015, Vol. 9, p212-215. 4p.

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Auger electron spectroscopy

• Authors : Somorjai, G

• Source: Conference: EXXON conference on surface science, Linden, NJ, USA, 4 Dec 1980

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Scanning Auger electron spectroscopy studies of grain-boundary segregation in Type 304 stainless steel

• Authors : Busch, D

• Source: Conference: 5. Bolton Landing conference, Lake George, NY, USA, 27 Aug 1978

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Oxygen and titanium sputtering yields as determined by laser fluorescence and Auger electron spectroscopy for monolayer oxygen coverage of polycrystalline Ti

• Authors : DeWald, A

• Source: Conference: 5. international conference on plasma surface, Gatlinburg, TN, USA, 3 May 1982

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Auger electron spectroscopy of fracture surfaces in irradiated type 304 stainless steel

• Authors : Bloom, E

• Source: Conference: 4. Bolton Landing conference, grain boundaries in engineering materials, Bolton Landing, New York, USA, 9 Jun 1974; Other Information: Orig. Receipt Date: 31-DEC-74

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Auger electron spectroscopy of alloy surfaces

• Authors : Somorjai, G

• Source: Conference: Conference of the Faraday Society on electron spectroscopy of solids and surfaces, Vancouver, B.C., Canada, 15 Jul 1975; Other

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Method for Auger Analyses of Thick Insulators Samples.

• Authors : Spasov, Georgi Spasov^1,2

• Source: Annual Journal of Electronics. 2014, Vol. 8, p40-42. 3p.

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AES, EELS and TRIM simulation method study of InP(100) subjected to Ar+, He+ and H+ ions bombardment.

• Authors : Ghaffour, M.¹ ; Abdellaoui, A.¹; Bouslama, M.¹

• Source: EPJ Web of Conferences. 2012, Issue 29, p00020-p.1-00020-p.8. 8p.

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