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  • 1-10 of  915 نتائج ل ""PACS: 85.42""

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Format : Conference Materials Subject : [spi.meca.stru]engineering sciences [physics]/mechanics [physics.med-ph]/structural mechanics [physics.class-ph] Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Subject : test فلترة بواسطة : موضوع
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Conference

Extension of Quasi-Load Insensitive Class-E Doherty Operation with Complex Load Trajectories

Subjects: class-E; Doherty; load modulationLarnaca; Cyprus

  • Source: 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME 2024)https://hal.science/hal-0463402519th Conference on Ph.D Research in Microelectronics and Electronics (PRIME

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Conference

Impact of Using Off-Chip Memories on Reliability of Edge Computing Systems to Single-Event Upsets

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMaspalomas; Canary Islands; Spain

  • Source: Conference on Radiation Effects on Components and Systems (RADECS 2024) ; https://hal.science/hal-04615508 ; Conference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024,

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Conference

Deploying Compact and Dependable DNNs in Safety-critical Applications

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsThe Hague; Netherlands

  • Source: European Test Symposium (ETS 2024) - PhD Forum ; https://hal.science/hal-04615328 ; European Test Symposium (ETS 2024) - PhD Forum, May

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Conference

Deploying Compact and Dependable DNNs in Safety-critical Applications

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsToulouse; France

  • Source: Colloque national du groupement de recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 2024) ; https://hal.science/hal-04615293 ; Colloque national du groupement de recherche

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Conference

Deploying Compact and Dependable DNNs in Safety-critical Applications

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsThe Hague; Netherlands

  • Source: European Test Symposium (ETS 2024) - PhD Forum ; https://hal.science/hal-04615328 ; European Test Symposium (ETS 2024) - PhD Forum, May

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Conference

Impact of Using Off-Chip Memories on Reliability of Edge Computing Systems to Single-Event Upsets

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMaspalomas; Canary Islands; Spain

  • Source: Conference on Radiation Effects on Components and Systems (RADECS 2024) ; https://hal.science/hal-04615508 ; Conference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024,

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Conference

Deploying Compact and Dependable DNNs in Safety-critical Applications

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsToulouse; France

  • Source: Colloque national du groupement de recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 2024) ; https://hal.science/hal-04615293 ; Colloque national du groupement de recherche

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Conference

Resiliency Approaches in Convolutional, Photonic, and Spiking Neural Networks

Subjects: Convolutional Neural Networks; Spiking Neural Networks; Photonic Neural NetworksBrazilMaceio, Brazil

  • Source: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr

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Conference

Resiliency Approaches in Convolutional, Photonic, and Spiking Neural Networks

Subjects: Convolutional Neural Networks; Spiking Neural Networks; Photonic Neural NetworksBrazilMaceio, Brazil

  • Source: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr

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Conference

Resiliency Approaches in Convolutional, Photonic, and Spiking Neural Networks

Subjects: Convolutional Neural Networks; Spiking Neural Networks; Photonic Neural NetworksBrazilMaceio, Brazil

  • Source: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr

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  • 1-10 of  915 نتائج ل ""PACS: 85.42""