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Conference

Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

Authors : Martins Pio de Mattos, André; Almeida dos Santos, Douglas; Gupta, Viyas ...

Subjects: SRAM; Radiation; Single-Event EffectsToulouse; France

Source: RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems ; https://hal.science/hal-04266897 ; RADECS 2023 - European Conference on Radiation and Its Effects on

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Conference

Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

Authors : Martins Pio de Mattos, André; Almeida dos Santos, Douglas; Gupta, Viyas ...

Subjects: SRAM; Radiation; Single-Event EffectsToulouse; France

Source: RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems ; https://hal.science/hal-04266897 ; RADECS 2023 - European Conference on Radiation and Its Effects on

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Conference

Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Authors : Almeida dos Santos, Douglas; Aviles, Pablo M.; Martins Pio de Mattos, André ...

Subjects: Checkpoint; Fault Tolerance; NeutronToulouse; France

Source: RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems ; https://hal.science/hal-04266891 ; RADECS 2023 - European Conference on Radiation and Its Effects on

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Conference

Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

Authors : Martins Pio de Mattos, André; Almeida dos Santos, Douglas; Gupta, Viyas ...

Subjects: SRAM; Radiation; Single-Event EffectsToulouse; France

Source: RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems ; https://hal.science/hal-04266897 ; RADECS 2023 - European Conference on Radiation and Its Effects on

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Conference

Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Authors : Almeida dos Santos, Douglas; Aviles, Pablo M.; Martins Pio de Mattos, André ...

Subjects: Checkpoint; Fault Tolerance; NeutronToulouse; France

Source: RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems ; https://hal.science/hal-04266891 ; RADECS 2023 - European Conference on Radiation and Its Effects on

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Conference

Assessing the Reliability of a Network-on-Chip through Physical Validation

Authors : Mafra, Gustavo, S.; Rausch, Thiago, H.; Almeida dos Santos, Douglas ...

Subjects: Networks-on-Chip; Fault Tolerance; Neutron RadiationBrasilia; Brazil

Source: LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03834119 ; LASSS/LACW 2022 - Joint 3rd

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Conference

Effects of High-Energy Protons on a Self-Refresh DRAM

Authors : Matana Luza, Lucas; Imianosky, Carolina; Martins Pio de Mattos, André ...

Subjects: high-energy protons; radiation effects; self-refresh DRAMVirtual Event; Italy

Source: SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03832662 ; SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System

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Conference

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Authors : Almeida dos Santos, Douglas; Martins Pio de Mattos, André; Matana Luza, Lucas ...

Subjects: RISC-V; System-on-Chip; Fault ToleranceAustin; United States

Source: DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03833983 ; DFT 2022 - 35th IEEE International

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Conference

Assessing the Reliability of a Network-on-Chip through Physical Validation

Authors : Mafra, Gustavo, S.; Rausch, Thiago, H.; Almeida dos Santos, Douglas ...

Subjects: Networks-on-Chip; Fault Tolerance; Neutron RadiationBrasilia; Brazil

Source: LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03834119 ; LASSS/LACW 2022 - Joint 3rd

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Conference

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Authors : Almeida dos Santos, Douglas; Martins Pio de Mattos, André; Matana Luza, Lucas ...

Subjects: RISC-V; System-on-Chip; Fault ToleranceAustin; United States

Source: DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03833983 ; DFT 2022 - 35th IEEE International

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فلترة النتائج

Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Assessing the Reliability of a Network-on-Chip through Physical Validation

Effects of High-Energy Protons on a Self-Refresh DRAM

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Assessing the Reliability of a Network-on-Chip through Physical Validation

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

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