نتائج البحث

Dislocation-Point Defects-Induced by X-Irradiation Interaction in Alkali Halide Crystals

• Authors : Kohzuki, Yohichi

• Source: https://www.intechopen.com/books/.

تفاصيل العنوان

Color Centers in Semiconductors for Quantum Applications : A High-Throughput Search of Point Defects in SiC

• Authors : Davidsson, Joel

• Source: Linköping Studies in Science and Technology. Dissertations ; ISSN 0345-7524 ; ISBN 9789179297305

تفاصيل العنوان

Electron Paramagnetic Resonance Studies of Point Defects in AlGaN and SiC

• Authors : Trinh, Xuan Thang

• Source: Linköping Studies in Science and Technology. Dissertations ; ISSN 0345-7524 ; ISBN 9789175190648

تفاصيل العنوان

Electronic Magnetic Resonance of the Solid State (CSC symposium series : 1 ) / Application of magnetic multiple resonance techniques to the study of point defects in solids

• Authors : Spaeth, Johann-Martin

Subjects: NW.2

تفاصيل العنوان

Semi-insulating III - V Materials: Hakone 1986 / Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors

• Authors : Spaeth, Johann-Martin

Subjects: NW.2

تفاصيل العنوان

International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12) / Application of optically detected magnetic resonance to the characterization of point defects in semiconductors

• Authors : Spaeth, Johann-Martin

Subjects: NW.2

تفاصيل العنوان

Electronic Magnetic Resonance of the Solid State (CSC symposium series : 1 ) / Application of magnetic multiple resonance techniques to the study of point defects in solids

• Authors : Spaeth, Johann-Martin

Subjects: NW.2

تفاصيل العنوان

International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12) / Application of optically detected magnetic resonance to the characterization of point defects in semiconductors

• Authors : Spaeth, Johann-Martin

Subjects: NW.2

تفاصيل العنوان

Semi-insulating III - V Materials: Hakone 1986 / Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors

• Authors : Spaeth, Johann-Martin

Subjects: NW.2

تفاصيل العنوان