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Academic Journal

Transmission electron microscopy (TEM) characterization of GaN nanowires

  • Authors : Bando, Y

  • Source: Journal of Electronic Materials; 31; 5; Other Information: Journal Publication Date: 05/2002; PBD: 6 May 2002

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  • 1-10 ل  76,382 نتائج ل ""transmission electron microscopy (TEM)""