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Academic Journal

Study of flaws inspection in ceramics materials using UT and X-Ray methods.

  • Source: International Journal of Applied Electromagnetics & Mechanics. 2012, Vol. 39 Issue 1-4, p413-418. 6p. 8 Diagrams, 1 Graph.

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  • 1-7 ل  7 نتائج ل ""silicon nitride""