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Academic Journal

Characterization and electrical modeling of polycrystalline silicon vertical thin film transistors

Subjects: Low temperature polycrystalline silicon; Conduction modeling; Vertical thin film transistors

  • Source: ISSN: 0038-1101 ; Solid-State Electronics ; https://hal.science/hal-02891811 ; Solid-State Electronics, 2020, 171, pp.107798. ⟨10.1016/j.sse.2020.107798⟩.

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