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النتائج لكل صفحة: 10

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Subject : transistors

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Investigation of the mechanism of transport across the poly/monocrystalline silicon interface in polysilicon-emitter bipolar transistors based on variations in the interface treatment process.

Authors : JAMASB, Shahriar¹

Source: Turkish Journal of Electrical Engineering & Computer Sciences. 2019, Vol. 27 Issue 5, p3923-3934. 12p.

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Academic Journal

Amorphous Tin Oxide Applied to Solution Processed Thin-Film Transistors.

Authors : Avis, Christophe¹ (AUTHOR) ; Kim, YounGoo¹ (AUTHOR); Jang, Jin¹ (AUTHOR)

Source: Materials (1996-1944). Oct2019, Vol. 12 Issue 20, p3341-3341. 1p. 1 Diagram, 4 Graphs.

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Electrical and Structural Characteristics of Excimer Laser-Crystallized Polycrystalline Si1−xGex Thin-Film Transistors.

Authors : Jang, Kyungsoo¹ (AUTHOR) ; Kim, Youngkuk¹ (AUTHOR); Park, Joonghyun¹ (AUTHOR)

Source: Materials (1996-1944). Jun2019, Vol. 12 Issue 11, p1739. 1p. 2 Diagrams, 5 Graphs.

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