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Conspiracies and Test Compromise: An Evaluation of the Resistance of Test Systems to Small-scale Cheating.

• Authors : Guo, Jing¹ (AUTHOR) ; Tay, Louis¹ (AUTHOR); Drasgow, Fritz¹ (AUTHOR)

• Source: International Journal of Testing. 2009, Vol. 9 Issue 4, p283-309. 27p. 3 Charts, 2 Graphs.

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Development of immunochromatographic test systems for express detection of plant viruses.

• Authors : Byzova, N.¹ ; Safenkova, I.²; Chirkov, S.²

• Source: Applied Biochemistry & Microbiology. Mar2009, Vol. 45 Issue 2, p204-209. 6p. 1 Black and White Photograph, 1 Diagram, 3 Charts, 3 Graphs.

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ATE Buyers Guide.

• Source: EE: Evaluation Engineering. May2009, Vol. 48 Issue 5, p44-50. 7p.

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Demand for avionics test systems is steady despite economic challenges.

• Authors : McHALE, JOHN

• Source: Military & Aerospace Electronics. Nov2009, Vol. 20 Issue 11, p6-8. 2p.

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Understanding Star Switching.

• Authors : Strickler, Walt¹

• Source: EE: Evaluation Engineering. Nov2009, Vol. 48 Issue 11, p20-28. 5p.

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Redefining Memory Test.

• Authors : West, Scott

• Source: EE: Evaluation Engineering. Jan2009, Vol. 48 Issue 1, p37-42. 6p.

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Qualifying input test data for model transformations.

• Authors : Fleurey, Franck¹ ; Baudry, Benoit¹ ; Muller, Pierre-Alain¹

• Source: Software & Systems Modeling. Apr2009, Vol. 8 Issue 2, p185-203. 19p. 29 Diagrams, 1 Chart.

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Pulsed Test Systems Characterize Power FETs.

• Authors : TSIRONIS, CHRISTOS¹; GASSELING, TONY² ; OUARDIRHI, ZACHARIA³

• Source: Microwaves & RF. Feb2009, Vol. 48 Issue 2, p90-98. 6p. 1 Color Photograph, 2 Diagrams, 1 Graph.

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Switches Get No Respect.

• Authors : Lecklider, Tom

• Source: EE: Evaluation Engineering. May2009, Vol. 48 Issue 5, p24-32. 6p.

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NJ Hospitals To Test System of Incentives.

• Source: Renal & Urology News. Sep2009, Vol. 8 Issue 9, p24-24. 1/7p.

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