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Academic Journal

A Chip Select Access Time Measurement Method for High-Speed MOS Static RAM.

Authors : Nishimura, Tasumasa¹; Tanaka, Koji¹; Ichinose, Katsuki¹

Source: Electronics & Communications in Japan, Part 2: Electronics. Sep90, Vol. 73 Issue 9, p42-53. 12p.

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Academic Journal

Behavioural and Neuropharmacological Aspects of Maternal Aggression in Rodents.

Authors : Mos, Jan¹; Oilver, Berend¹; van Oorschot, Ruud¹

Source: Aggressive Behavior. 1990, Vol. 16 Issue 3/4, p145-163. 19p.

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Academic Journal

Present Status and Future of High-Performance Submicron Devices.

Authors : Masuhara, Toshiaki¹; Shimohigashi, Katsuhiro¹; Takeda, Eiji¹

Source: Electronics & Communications in Japan, Part 2: Electronics. Feb90, Vol. 73 Issue 2, p84-99. 16p.

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Academic Journal

Care and Justice Moral Orientation: A Scale for Its Assessment.

Authors : Yacker, Nancy; Weinberg, Sharon L.

Source: Journal of Personality Assessment. Fall1990, Vol. 55 Issue 1/2, p18. 10p.

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Academic Journal

Formation of Silicon Oxide by the Low-Temperature Process and Its Application to Electron Devices.

Authors : Nomura, Shigeru¹; Kitamura, Naoko¹; Yoshino, Masaki¹

Source: Electronics & Communications in Japan, Part 2: Electronics. Jul90, Vol. 73 Issue 7, p97-105. 9p.

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Academic Journal

Defect Characterization and Gettering Effect in Excimer Laser Gettering.

Authors : Sakai, Akira¹; Ohshita, Yoshio¹; Ishitani, Akihiko¹

Source: Electronics & Communications in Japan, Part 2: Electronics. May90, Vol. 73 Issue 5, p91-97. 7p.

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Academic Journal

Device and Interconnect Structures Suitable for Ultrahigh-Speed LSIs.

Authors : Ohmi, Tadahiro¹; Imai, Shigeru¹; Hashimoto, Takashi²

Source: Electronics & Communications in Japan, Part 2: Electronics. Mar1990, Vol. 73 Issue 3, p74-80. 7p.

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Academic Journal

Fundamental Properties of Ultrathin SOI MOSFETs Fabricated by Electron-Beam Anneal Recrystallization.

Authors : Yoshimi, Makoto¹; Takahashi, Minoru¹; Hazama, Hiroaki¹

Source: Electronics & Communications in Japan, Part 2: Electronics. Apr90, Vol. 73 Issue 4, p72-82. 11p.

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Academic Journal

The Optimization of a DRAM CMOS Row Decoder Circuit.

Authors : Ozaki, Hideyuki¹; Miyamoto, Hiroshi²; Yamagata, Tadato²

Source: Electronics & Communications in Japan, Part 2: Electronics. Mar1990, Vol. 73 Issue 3, p1-9. 9p.

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فلترة النتائج

A Chip Select Access Time Measurement Method for High-Speed MOS Static RAM.

Behavioural and Neuropharmacological Aspects of Maternal Aggression in Rodents.

Present Status and Future of High-Performance Submicron Devices.

Care and Justice Moral Orientation: A Scale for Its Assessment.

Formation of Silicon Oxide by the Low-Temperature Process and Its Application to Electron Devices.

Defect Characterization and Gettering Effect in Excimer Laser Gettering.

Device and Interconnect Structures Suitable for Ultrahigh-Speed LSIs.

Fundamental Properties of Ultrathin SOI MOSFETs Fabricated by Electron-Beam Anneal Recrystallization.

The Optimization of a DRAM CMOS Row Decoder Circuit.

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