نتائج البحث

A voting-based ensemble feature network for semiconductor wafer defect classification.

• Authors : Misra, Sampa¹ (AUTHOR); Kim, Donggyu¹ (AUTHOR); Kim, Jongbeom¹ (AUTHOR)

• Source: Scientific Reports. 9/28/2022, Vol. 12 Issue 1, p1-12. 12p.

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Exploring complexity of class-A Beta-lactamase family using physiochemical-based multiplex networks.

• Authors : Bhadola, Pradeep¹ (AUTHOR) ; Deo, Nivedita² (AUTHOR)

• Source: Scientific Reports. 11/23/2023, Vol. 13 Issue 1, p1-11. 11p.

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Few-shot out-of-distribution detection for automated screening in retinal OCT images using deep learning.

• Authors : Araújo, Teresa¹ (AUTHOR) ; Aresta, Guilherme¹ (AUTHOR); Schmidt-Erfurth, Ursula¹ (AUTHOR)

• Source: Scientific Reports. 11/18/2023, Vol. 13 Issue 1, p1-14. 14p.

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A voting-based ensemble feature network for semiconductor wafer defect classification

• Authors : Sampa Misra; Donggyu Kim; Jongbeom Kim

Subjects: Medicine; Science

• Source: Scientific Reports, Vol 12, Iss 1, Pp 1-12 (2022)

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Exploring complexity of class-A Beta-lactamase family using physiochemical-based multiplex networks

• Authors : Pradeep Bhadola; Nivedita Deo

Subjects: Medicine; Science

• Source: Scientific Reports, Vol 13, Iss 1, Pp 1-11 (2023)

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Few-shot out-of-distribution detection for automated screening in retinal OCT images using deep learning

• Authors : Teresa Araújo; Guilherme Aresta; Ursula Schmidt-Erfurth

Subjects: Medicine; Science

• Source: Scientific Reports, Vol 13, Iss 1, Pp 1-14 (2023)

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A study of green roof and impact on the temperature of buildings using integrated IoT system

• Authors : Kuo-Hsiung Tseng; Meng-Yun Chung; Li-Hsien Chen

Subjects: Medicine; Science

• Source: Scientific Reports, Vol 12, Iss 1, Pp 1-16 (2022)

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Cooperation in group-structured populations with two layers of interactions.

• Authors : Zhang Y; School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing 100083, China.; Center for Systems and Control, State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871, China.

• Source: Scientific reports [Sci Rep] 2015 Dec 03; Vol. 5, pp. 17446. Date of Electronic Publication: 2015 Dec 03.Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN:

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